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Posts by category

• Category: Application Note
  • GCIB-SEM: 3D electron microscopy with < 10nm isotropic resolution
  • Why you shouldn’t overlook C60 beams just yet
  • How the J105 SIMS works: An introductory guide
  • Drug detection with high-sensitivity using ToF SIMS
  • Cocaine metabolite imaging in fingerprints with Water Cluster SIMS
  • High-resolution molecular imaging ToF SIMS
  • Detecting pollutants in a Cherry Blossom leaf
  • Ion Beams and their Applications
  • ToF SIMS of Rough or Uneven Samples
  • Depth Profiling in ToF-SIMS with the J105 SIMS
  • ToF-SIMS Analysis on Insulating Samples
• Category: Careers
  • Category: Employee Spotlight
    • Employee Spotlight: Dr Allen Bellew
    • Employee Spotlight: Kate McHardy – Head of Sales
    • Employee Spotlight: Gavyn Trowbridge
    • Employee Spotlight: Dr Michal Ryszka
    • Employee Spotlight: Dr Naoko Sano
• Category: Events
• Category: News
  • New funding boosts the UK’s future in Quantum manufacturing
  • Stigmatic imaging SIMS prototype installed at the University of Oxford
  • Analyse v2.0.2.15 Release
  • GCIB 10S Webinar in association with UCVAC
  • RADIATE: Research And Development with Ion Beams – Advancing Technology in Europe
  • A New Tool for Quantum Device Fabrication
  • PacSurf 2018
  • The 7th Chinese National Conference on Secondary Ion Mass Spectrometry (SIMS-China VII)
  • Ionoptika’s New Website!
  • ASMS San Diego 2018
  • 5th Mass Spectrometry Imaging Symposium – Sheffield Hallam University
• Category: Techniques
  • ToF SIMS – Time of Flight Secondary Ion Mass Spectrometry

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