Charged Particle Imaging System
The IGM 300 is a complete charged particle detection and imaging system. Featuring beam rastering, a high dynamic range secondary electron/ion detection system, and dedicated software with a range of advanced features, the IGM 300 is a must-have accessory to your ion beam system.
All Ionoptika ion beam systems require an external raster/imaging system, with the exception of the GCIB 10S, which features an integrated sample current imaging system.
- Beam scanning & control.
- Secondary electron / ion detection.
- Low noise, high gain channeltron detector.
- Easy installation via NW 35 CF UHV compatible flange.
- Feature-packed imaging software.