Highly focused low-damage ion beam for SIMS

The GCIB SM is a 70 kV gas cluster ion beam designed for high-resolution SIMS imaging of organic samples without the fragmentation typically associated with ion beam bombardment. Combined with the J105 SIMS, the GCIB SM extends the available mass range to > 2500 Da with state-of-the-art resolving power.

Key Features

  • High Resolution Gas Cluster Beam for SIMS
  • Beam energy enhanced signal
  • Clusters > 10,000 (> 400 kDa)
  • 1.5 μm spot size
  • Reveal intact molecular ions > 2,500 Da