Applications
TOF SIMS
APPLICATIONS
TOF SIMS
Time-of-Flight Secondary Ion Mass Spectrometry (ToF SIMS) is a powerful surface analysis technique used to study the chemical composition of solid surfaces and thin films in three dimensions. Ion beams are central to TOF SIMS, as a beam of primary ions generates the secondary ions by bombarding a target surface.
Ionoptika pioneered using gas cluster ion beams (GCIB) for TOF SIMS applications with the J105 SIMS. GCIBs are very gentle and cause almost no damage, allowing the analysis of more sensitive samples. This has caused an explosion of new applications, particularly in the life sciences.
Explore applications of the J105 SIMS and our ion beams for TOF SIMS below.
3D TOF SIMS image of multi-layer glass coating. The potassium signal reveals two “tunnels” through the layer just a few microns wide. TOF SIMS data is characterised by high spatial resolution and chemical sensitivity, especially when using cluster ion beams.
Products
J105 SIMS
Time-of-Flight Secondary Ion Mass Spectrometer that delivers class-leading sensitivity with exceptional imaging and mass spectrometry performance.
IOG C60-40
A high-performance cluster beam for molecular SIMS analysis. From bio-medical applications to polymer science and metallurgy, the C60-40 is an excellent all-round ion beam.
GCIB 70
A high-resolution gas cluster ion beam with spot sizes down to 1.5 μm. Gas clusters are extremely efficient at sputtering organic, and biological materials, producing intact high-mass molecular ions. Available with Water Source upgrade.
