Studying the physics and chemistry of surfaces and interfaces requires clean surfaces, free from contamination. Surface analysis techniques such as Secondary Ion Mass Spectrometry (SIMS), X-ray Photoelectron Spectroscopy (XPS), Auger Electron Spectroscopy (AES), and Low Energy Electron Diffraction (LEED) all use ion beams to prepare surfaces for analysis, or in some cases, to provide the analysis.
Ion beams such as C60 and gas cluster ion beams (GCIB) efficiently remove organic matter from surfaces. In a process known as depth profiling, ion beams can also remove a volume of material, known as sputtering, revealing a fresh surface for analysis.
Ionoptika provides ion beams and instrumentation to suit every Surface Science application. Explore our products and applications below.
XPS data showing the PET C 1s peaks before and after etching with a monatomic argon beam and a gas cluster ion beam.
|Sensitivity enhancement using chemically reactive gas cluster ion beams in secondary ion mass spectrometry (SIMS)
|M Lagator, I Berrueta Razo, T Royle, NP Lockyer
|Surface and Interface Analysis
|TOF SIMS, Water Source
|Characterization of buried interfaces using Ga Kα hard X-ray photoelectron spectroscopy (HAXPES)
|BF Spencer, SA Church, P Thompson, DJH Cant, S Maniyarasu, A Theodosiou, AN Jones, MJ Kappers, DJ Binks, RA Oliver, J Higgins, AG Thomas, T Thomson, AG Shard, WR Flavell
|Single Ion Implantation of Bismuth
|N Cassidy, P Blenkinsopp, I Brown, RJ Curry, BN Murdin, R Webb, D Cox
|Physica Status Solidi A
|Ion Implantation, Quantum Computing, Qubits, Q-One
|C-O Bond Dissociation and Induced Chemical Ionization Using High Energy (CO2)n+ Gas Cluster Ion Beam
|H Tian, D Maciazek, Z Postawa, BJ Garrison, N Winograd
|Journal of the American Society for Mass Spectrometry
|TOF SIMS, Cluster Beams
|Depth resolution at organic interfaces sputtered by argon gas cluster ions: the effect of energy, angle and cluster size
|MP Seah, SJ Spencer, R Havelund, IS Gilmore, AG Shard
|Depth profiling, XPS
|Analysis of protein coatings on gold nanoparticles by XPS and liquid-based particle sizing techniques
|NA Belsey, AG Shard, C Minelli