News | Ionoptika Ltd

Employee Spotlight: Kate McHardy – Head of Sales

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December 4, 2020

Ionoptika is very proud of its skilled and dedicated staff, who together with our loyal users…

Analyse v2.0.2.15 Release

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July 1, 2020

We are happy to announce the release of Analyse v2.0.2.15 for all J105 SIMS customers. This…

Ionoptika 2020

Employee Spotlight: Gavyn Trowbridge

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June 10, 2020

This month we move away from new hires to what will be a very familiar face to many of our customers around the world, Senior Test & Service Engineer, Gavyn Trowbridge.

Ionoptika 2020

GCIB-SEM: 3D electron microscopy with < 10nm isotropic resolution

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June 9, 2020

GCIB-SEM is a new technique that combines high resolution electron microscopy with the damage…

Ionoptika 2020

Why you shouldn’t overlook C60 beams just yet

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May 29, 2020

C60 cluster ion beams are a fantastic tool for analyzing both hard and soft materials. Composed…

Ionoptika 2020

GCIB 10S Webinar in association with UCVAC

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May 21, 2020

On Thursday, in collaboration with UCVAC, we held a webinar on the GCIB 10S Gas Cluster Ion…

Employee Spotlight: Dr Michal Ryszka

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May 6, 2020

This month, continuing the theme of new hires, we introduce Development Engineer, Dr. Michal Ryszka, who joined Ionoptika in 2019.

How the J105 SIMS works: An introductory guide

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April 24, 2020

The J105 SIMS is a state-of-the-art 3D imaging ToF SIMS combining innovative design with cutting-edge…

Drug detection with high-sensitivity using ToF SIMS

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April 17, 2020

The high attrition rate of pharmaceutical drug compounds adds enormously to the cost of those…

Employee Spotlight: Dr Naoko Sano

April 8, 2020

The first to be in the spotlight is one of most recent hires, Dr Naoko Sano, our new Applications Scientist. We asked Naoko about her career and what she enjoys about working at Ionoptika.