What is ToF SIMS? What is it used for, and what sort of information can it provide? Which…
https://secureservercdn.net/160.153.138.219/une.489.myftpupload.com/wp-content/uploads/2021/11/tof-sims-thumbnail-16-9.jpg?time=16424999558101439webmasterhttps://secureservercdn.net/160.153.138.219/une.489.myftpupload.com/wp-content/uploads/2018/06/IO_logo_black_700x322.pngwebmaster2021-11-19 11:48:262021-11-19 15:13:29ToF SIMS – Time of Flight Secondary Ion Mass SpectrometryIonoptika
Ionoptika is very proud of its skilled and dedicated staff, who together with our loyal users…
https://secureservercdn.net/160.153.138.219/une.489.myftpupload.com/wp-content/uploads/2021/06/allen-e1624897976711.jpg?time=1642499955500500webmasterhttps://secureservercdn.net/160.153.138.219/une.489.myftpupload.com/wp-content/uploads/2018/06/IO_logo_black_700x322.pngwebmaster2021-06-29 09:44:232021-06-29 10:03:30Employee Spotlight: Dr Allen Bellew
Ionoptika have installed a prototype mass spec instrument at the University of Oxford, marking…
https://secureservercdn.net/160.153.138.219/une.489.myftpupload.com/wp-content/uploads/2021/04/Oxford-RFI-install-scaled.jpg?time=164249995519202560webmasterhttps://secureservercdn.net/160.153.138.219/une.489.myftpupload.com/wp-content/uploads/2018/06/IO_logo_black_700x322.pngwebmaster2021-04-08 15:07:042021-04-09 08:32:12Stigmatic imaging SIMS prototype installed at the University of Oxford
Ionoptika is very proud of its skilled and dedicated staff, who together with our loyal users…
https://secureservercdn.net/160.153.138.219/une.489.myftpupload.com/wp-content/uploads/2020/12/Kate.jpg?time=1642499955624640webmasterhttps://secureservercdn.net/160.153.138.219/une.489.myftpupload.com/wp-content/uploads/2018/06/IO_logo_black_700x322.pngwebmaster2020-12-04 13:30:102020-12-04 13:30:13Employee Spotlight: Kate McHardy – Head of Sales
This month we move away from new hires to what will be a very familiar face to many of our customers around the world, Senior Test & Service Engineer, Gavyn Trowbridge.
GCIB-SEM is a new technique that combines high resolution electron microscopy with the damage…
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On Thursday, in collaboration with UCVAC, we held a webinar on the GCIB 10S Gas Cluster Ion…
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This month, continuing the theme of new hires, we introduce Development Engineer, Dr. Michal Ryszka, who joined Ionoptika in 2019.
https://secureservercdn.net/160.153.138.219/une.489.myftpupload.com/wp-content/uploads/2020/05/Michal-1.jpg?time=1642499955647800webmasterhttps://secureservercdn.net/160.153.138.219/une.489.myftpupload.com/wp-content/uploads/2018/06/IO_logo_black_700x322.pngwebmaster2020-05-06 15:49:132020-06-10 13:41:05Employee Spotlight: Dr Michal Ryszka
ToF SIMS – Time of Flight Secondary Ion Mass Spectrometry
New funding boosts the UK’s future in Quantum manufacturing
Employee Spotlight: Dr Allen Bellew
C60-20S
Stigmatic imaging SIMS prototype installed at the University of Oxford
Employee Spotlight: Kate McHardy – Head of Sales
Analyse v2.0.2.15 Release
Employee Spotlight: Gavyn Trowbridge
GCIB-SEM: 3D electron microscopy with < 10nm isotropic resolution
Why you shouldn’t overlook C60 beams just yet
GCIB 10S Webinar in association with UCVAC
Employee Spotlight: Dr Michal Ryszka