Applications
J105 SIMS
APPLICATIONS
J105 SIMS
The J105 SIMS is a state-of-the-art time-of-flight secondary ion mass spectrometer. The J105 is known for its pioneering design that enables cluster ion beams to be used as the primary source. A powerful imaging mass spectrometry technique, the J105’s applications span many disciplines, including life sciences, materials science, and forensic science.
Various unique ion beams are available for the J105, from C60 to a water cluster beam, making the J105 a very different instrument from other ToF SIMS. The ability to run multiple ion beams with very different properties is a great advantage. The GCIB is ideal for soft, organic samples, C60 is excellent on both hard and soft matter, and the LMIG/ECR are suitable for hard, non-biological samples.
Explore the applications of the J105 SIMS below.
TOF SIMS image of a fingerprint captured on the J105 SIMS. A single mass channel is shown, m/z 290.14, corresponding to the cocaine metabolite benzoylecgonine, or BZE.
Products
J105 SIMS
Time-of-Flight Secondary Ion Mass Spectrometer that delivers class-leading sensitivity with exceptional imaging and mass spectrometry performance.
GCIB 70
A high-resolution gas cluster ion beam with spot sizes down to 1.5 μm. Gas clusters are extremely efficient at sputtering organic, and biological materials, producing intact high-mass molecular ions. Available with Water Source upgrade.
IOG C60-40
A high-performance cluster beam for molecular SIMS analysis. From bio-medical applications to polymer science and metallurgy, the C60-40 is an excellent all-round ion beam.
