The J105 SIMS is a state-of-the-art time-of-flight secondary ion mass spectrometer. The J105 is known for its pioneering design that enables cluster ion beams to be used as the primary source. A powerful imaging mass spectrometry technique, the J105’s applications span many disciplines, including life sciences, materials science, and forensic science.
Various unique ion beams are available for the J105, from C60 to a water cluster beam, making the J105 a very different instrument from other ToF SIMS. The ability to run multiple ion beams with very different properties is a great advantage. The GCIB is ideal for soft, organic samples, C60 is excellent on both hard and soft matter, and the LMIG/ECR are suitable for hard, non-biological samples.
Explore the applications of the J105 SIMS below.
TOF SIMS image of a fingerprint captured on the J105 SIMS. A single mass channel is shown, m/z 290.14, corresponding to the cocaine metabolite benzoylecgonine, or BZE.