Secondary Electron Detection System
The SED 03 is a high-gain channeltron-based system for the detection of secondary electrons or ions, providing an amplified signal suitable for feeding into an image display system. The system comprises an SED, pre-amplifier, power supply, and cables.
The SED 03 is available on its own or as part of the IGM 300 Charged Particle Imaging System.
- High gain channeltron detector up to 6×107 @ 3 kV
- Slim detector assembly for easy integration.
- Electron & ion detection modes.
- Comprehensive software control package