SED 03

Secondary Electron Detection System

The SED 03 is a high-gain channeltron-based system for the detection of secondary electrons or ions, providing an amplified signal suitable for feeding into an image display system. The system comprises an SED, pre-amplifier, power supply, and cables.

The SED 03 is available on its own or as part of the IGM 300 Charged Particle Imaging System.

Key Features

  • High gain channeltron detector up to 6×107 @ 3 kV
  • Slim detector assembly for easy integration.
  • Electron & ion detection modes.
  • Comprehensive software control package