Electron microscopy is one of the world’s most widely used analysis techniques, particularly for materials and life sciences. The high-resolution imaging capabilities can resolve features down to the nanoscale (SEM) or even to the atomic scale (TEM). Developed alongside each other, EM and ion beams share many applications.
Liquid metal or plasma ion beams are frequently paired with SEM, so-called FIB-SEM, to etch or mill away material revealing a new surface for inspection.
The process of lamella prep for TEM analysis involves multiple ion beam steps, including low-energy argon polishing for ultra-high-resolution samples.
GCIB-SEM is a new technique combining SEM imaging with low-damage GCIB sputtering to build up high-resolution 3D data sets.
As well as a suite of ion beams for all applications, Ionoptika also provides imaging systems to add secondary electron imaging to any ion beam system. Explore our range of products and applications below.
GCIB-SEM: 3D SEM Tomography of a fly brain, captured by interlacing high-resolution SEM with GCIB sputtering. Courtesy of Dr. Ken Hayworth, HHMI Janelia Research Campus.
|GCIB 10S||Gas cluster ion beam SEM for imaging of large tissue samples with 10?nm isotropic resolution||KJ Hayworth, D Peale, M Januszewski, GW Knott, Z Lu, CS Xu, HF Hess||Nature Methods||2020||Depth Profiling, SEM, GCIB-SEM|
|GCIB 10S||Serial Thick Section Gas Cluster Ion Beam Scanning Electron Microscopy||KJ Hayworth, D Peale, Z Lu, CS Xu, HF Hess||Microscopy and Microanalysis||2018||SEM, GCIB-SEM|