Posts

Ion Beams and their Applications
Ion beams come in many shapes and sizes, with multiple source options and applications. A…

High-resolution multi-omics profiling of individual cells
In a landmark publication, Tian et al. demonstrate the feasibility of combined GCIB/C60 SIMS…

Stigmatic imaging SIMS prototype installed at the University of Oxford
Ionoptika have installed a prototype mass spec instrument at the University of Oxford, marking…

GCIB-SEM: 3D electron microscopy with < 10nm isotropic resolution
GCIB-SEM is a new technique that combines high resolution electron microscopy with the damage…

Why you shouldn’t overlook C60 beams just yet
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C60 cluster ion beams are a fantastic tool for analyzing both hard and soft materials. Composed…

GCIB 10S Webinar in association with UCVAC
On Thursday, in collaboration with UCVAC, we held a webinar on the GCIB 10S Gas Cluster Ion…

Drug detection with high-sensitivity using ToF SIMS
The high attrition rate of pharmaceutical drug compounds
adds enormously to the cost of those…

RADIATE: Research And Development with Ion Beams – Advancing Technology in Europe
Ionoptika has joined forces with 14 partners from public research and 3 other SMEs for…

High-resolution molecular imaging ToF SIMS
Historically ToF SIMS has not been sensitive to intact molecules due to the excessive fragmentation…

Detecting pollutants in a Cherry Blossom leaf
Plant samples such as leaves are a challenging sample for ToF SIMS. Composed of insulating…

ToF SIMS of Rough or Uneven Samples
A common problem faced by TOF SIMS analysis is loss of peak resolution and mass accuracy on…

Depth Profiling in ToF-SIMS with the J105 SIMS
Depth profiling is a powerful technique in surface analysis for examining interfaces and exploring…