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photo of ion beam column housing

Ion Beams and their Applications

Ion beams come in many shapes and sizes, with multiple source options and applications. A…
Picture of a human melanoma cell line growing in tissue culture

High-resolution multi-omics profiling of individual cells

In a landmark publication, Tian et al. demonstrate the feasibility of combined GCIB/C60 SIMS…

Stigmatic imaging SIMS prototype installed at the University of Oxford

Ionoptika have installed a prototype mass spec instrument at the University of Oxford, marking…
GCIB SEM GCIB 10S gas cluster ion beamIonoptika 2020

GCIB-SEM: 3D electron microscopy with < 10nm isotropic resolution

GCIB-SEM is a new technique that combines high resolution electron microscopy with the damage…
C60 moleculeIonoptika 2020

Why you shouldn’t overlook C60 beams just yet

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C60 cluster ion beams are a fantastic tool for analyzing both hard and soft materials. Composed…
gcib 10s webinarIonoptika 2020

GCIB 10S Webinar in association with UCVAC

On Thursday, in collaboration with UCVAC, we held a webinar on the GCIB 10S Gas Cluster Ion…

Drug detection with high-sensitivity using ToF SIMS

The high attrition rate of pharmaceutical drug compounds adds enormously to the cost of those…

RADIATE: Research And Development with Ion Beams – Advancing Technology in Europe

Ionoptika has joined forces with 14 partners from public research and 3 other SMEs for…
Featured ImageIonoptika Ltd 2020

High-resolution molecular imaging ToF SIMS

Historically ToF SIMS has not been sensitive to intact molecules due to the excessive fragmentation…
Cherry blossoms mount fuji

Detecting pollutants in a Cherry Blossom leaf

Plant samples such as leaves are a challenging sample for ToF SIMS. Composed of insulating…
SIMS showing Cr signal of M1.6 screw thread

ToF SIMS of Rough or Uneven Samples

A common problem faced by TOF SIMS analysis is loss of peak resolution and mass accuracy on…
3D SIMS overlay of a single Tetrahymena cell in water ice on a silicon substrate.

Depth Profiling in ToF-SIMS with the J105 SIMS

Depth profiling is a powerful technique in surface analysis for examining interfaces and exploring…