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GCIB SEM GCIB 10S gas cluster ion beamIonoptika 2020

GCIB-SEM: 3D electron microscopy with < 10nm isotropic resolution

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GCIB-SEM is a new technique that combines high resolution electron microscopy with the damage…
gcib 10s webinarIonoptika 2020

GCIB 10S Webinar in association with UCVAC

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On Thursday, in collaboration with UCVAC, we held a webinar on the GCIB 10S Gas Cluster Ion…
Featured ImageIonoptika Ltd 2020

High-resolution molecular imaging ToF SIMS

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Historically ToF SIMS has not been sensitive to intact molecules due to the excessive fragmentation…
ion beams and their applications

Ion Beams and their Applications

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Ion beams come in many shapes and sizes; different source technologies produce a wide range…
SIMS showing Cr signal of M1.6 screw thread

ToF SIMS of Rough or Uneven Samples

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A common problem faced by TOF SIMS analysis is loss of peak resolution and mass accuracy on…
3D SIMS overlay of a single Tetrahymena cell in water ice on a silicon substrate.

Depth Profiling in ToF-SIMS with the J105 SIMS

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Depth profiling is a powerful technique in surface analysis for examining interfaces and exploring…
SIMS overlay image of rock surface

ToF-SIMS Analysis on Insulating Samples

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Performing ToF-SIMS analysis on insulating samples can be particularly challenging. Surface…

Events

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GCIB-40 40kV Gas Cluster Ion Beam System
GCIB-SM 70kV Gas Cluster Ion Beam System
GCIB 10S Gas Cluster Ion BeamIonoptika 2020
GCIB 10S Gas Cluster Ion BeamIonoptika 2020

Publications

Below are a list of selected publications using Ionoptika equipment 2020 Interrogation…