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GCIB-SEM: 3D electron microscopy with < 10nm isotropic resolution
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GCIB-SEM is a new technique that combines high resolution electron microscopy with the damage…

GCIB 10S Webinar in association with UCVAC
On Thursday, in collaboration with UCVAC, we held a webinar on the GCIB 10S Gas Cluster Ion…

High-resolution molecular imaging ToF SIMS
Historically ToF SIMS has not been sensitive to intact molecules due to the excessive fragmentation…

Ion Beams and their Applications
Ion beams come in many shapes and sizes; different source technologies produce a wide range…

ToF SIMS of Rough or Uneven Samples
A common problem faced by TOF SIMS analysis is loss of peak resolution and mass accuracy on…

Depth Profiling in ToF-SIMS with the J105 SIMS
Depth profiling is a powerful technique in surface analysis for examining interfaces and exploring…

ToF-SIMS Analysis on Insulating Samples
Performing ToF-SIMS analysis on insulating samples can be particularly challenging. Surface…
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GCIB 40
The System
The GCIB 40 system comprises:
Ion source, comprising cluster…



Publications
Below are a list of selected publications using Ionoptika equipment
2020
Interrogation…