GCIB SEM GCIB 10S gas cluster ion beamIonoptika 2020

GCIB-SEM: 3D electron microscopy with < 10nm isotropic resolution

GCIB-SEM is a new technique that combines high resolution electron microscopy with the damage…
gcib 10s webinarIonoptika 2020

GCIB 10S Webinar in association with UCVAC

On Thursday, in collaboration with UCVAC, we held a webinar on the GCIB 10S Gas Cluster Ion…
Featured ImageIonoptika Ltd 2020

High-resolution molecular imaging ToF SIMS

Historically ToF SIMS has not been sensitive to intact molecules due to the excessive fragmentation…
ion beams and their applications

Ion Beams and their Applications

Ion beams come in many shapes and sizes; different source technologies produce a wide range…
SIMS showing Cr signal of M1.6 screw thread

ToF SIMS of Rough or Uneven Samples

A common problem faced by TOF SIMS analysis is loss of peak resolution and mass accuracy on…
3D SIMS overlay of a single Tetrahymena cell in water ice on a silicon substrate.

Depth Profiling in ToF-SIMS with the J105 SIMS

Depth profiling is a powerful technique in surface analysis for examining interfaces and exploring…
SIMS overlay image of rock surface

ToF-SIMS Analysis on Insulating Samples

Performing ToF-SIMS analysis on insulating samples can be particularly challenging. Surface…



GCIB-40 40kV Gas Cluster Ion Beam System


The System The GCIB 40 system comprises: Ion source, comprising cluster…
GCIB-SM 70kV Gas Cluster Ion Beam System
GCIB 10S Gas Cluster Ion BeamIonoptika 2020
GCIB 10S Gas Cluster Ion BeamIonoptika 2020


Below are a list of selected publications using Ionoptika equipment 2020 Interrogation…