Ionoptika 2020

Why you shouldn’t overlook C60 beams just yet

C60 cluster ion beams are a fantastic tool for analyzing both hard and soft materials. Composed…
Cherry blossoms mount fuji

Detecting pollutants in a Cherry Blossom leaf

Plant samples such as leaves are a challenging sample for ToF SIMS. Composed of insulating…
ion beams and their applications

Ion Beams and their Applications

Ion beams come in many shapes and sizes; different source technologies produce a wide range…
SIMS showing Cr signal of M1.6 screw thread

ToF SIMS of Rough or Uneven Samples

A common problem faced by TOF SIMS analysis is loss of peak resolution and mass accuracy on…
3D SIMS overlay of a single Tetrahymena cell in water ice on a silicon substrate.

Depth Profiling in ToF-SIMS with the J105 SIMS

Depth profiling is a powerful technique in surface analysis for examining interfaces and exploring…
SIMS overlay image of rock surface

ToF-SIMS Analysis on Insulating Samples

Performing ToF-SIMS analysis on insulating samples can be particularly challenging. Surface…


IOG C60-20S ion beamIonoptika 2021
C60-20 C60 Ion Beam System


Below are a list of selected publications using Ionoptika equipment 2021 Secondary…
C60-20 C60 Ion Beam System
C60-40 40kV C60 Ion Beam System
C60-20 C60 Ion Beam System