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High-resolution multi-omics profiling of individual cells
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In a landmark publication, Tian et al. demonstrate the feasibility of combined GCIB/C60 SIMS…

Why you shouldn’t overlook C60 beams just yet
C60 cluster ion beams are a fantastic tool for analyzing both hard and soft materials. Composed…

Detecting pollutants in a Cherry Blossom leaf
Plant samples such as leaves are a challenging sample for ToF SIMS. Composed of insulating…

Ion Beams and their Applications
Ion beams come in many shapes and sizes, with multiple source options and applications. A…

ToF SIMS of Rough or Uneven Samples
A common problem faced by TOF SIMS analysis is loss of peak resolution and mass accuracy on…

Depth Profiling in ToF-SIMS with the J105 SIMS
Depth profiling is a powerful technique in surface analysis for examining interfaces and exploring…

ToF-SIMS Analysis on Insulating Samples
Performing ToF-SIMS analysis on insulating samples can be particularly challenging. Surface…
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Publications
Below are a list of selected publications using Ionoptika equipment 2022 Sensitivity…


