Picture of a human melanoma cell line growing in tissue culture

High-resolution multi-omics profiling of individual cells

In a landmark publication, Tian et al. demonstrate the feasibility of combined GCIB/C60 SIMS…
C60 moleculeIonoptika 2020

Why you shouldn’t overlook C60 beams just yet

C60 cluster ion beams are a fantastic tool for analyzing both hard and soft materials. Composed…
Cherry blossoms mount fuji

Detecting pollutants in a Cherry Blossom leaf

Plant samples such as leaves are a challenging sample for ToF SIMS. Composed of insulating…
ion beams and their applications

Ion Beams and their Applications

Ion beams come in many shapes and sizes, with multiple source options and applications. A…
SIMS showing Cr signal of M1.6 screw thread

ToF SIMS of Rough or Uneven Samples

A common problem faced by TOF SIMS analysis is loss of peak resolution and mass accuracy on…
3D SIMS overlay of a single Tetrahymena cell in water ice on a silicon substrate.

Depth Profiling in ToF-SIMS with the J105 SIMS

Depth profiling is a powerful technique in surface analysis for examining interfaces and exploring…
SIMS overlay image of rock surface

ToF-SIMS Analysis on Insulating Samples

Performing ToF-SIMS analysis on insulating samples can be particularly challenging. Surface…


IOG C60-20S ion beamIonoptika 2021
C60-20 C60 Ion Beam System


Below are a list of selected publications using Ionoptika equipment 2022 Sensitivity…
C60-20 C60 Ion Beam System
IOG C60-40 40kV C60 ion beam systemIonoptika
C60-20 C60 Ion Beam System