Posts

Ion Beams and their Applications
Ion beams come in many shapes and sizes, with multiple source options and applications. A…

GCIB-SEM: 3D electron microscopy with < 10nm isotropic resolution
GCIB-SEM is a new technique that combines high resolution electron microscopy with the damage…

Why you shouldn’t overlook C60 beams just yet
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C60 cluster ion beams are a fantastic tool for analyzing both hard and soft materials. Composed…

RADIATE: Research And Development with Ion Beams – Advancing Technology in Europe
Ionoptika has joined forces with 14 partners from public research and 3 other SMEs for…

ToF SIMS of Rough or Uneven Samples
A common problem faced by TOF SIMS analysis is loss of peak resolution and mass accuracy on…

Depth Profiling in ToF-SIMS with the J105 SIMS
Depth profiling is a powerful technique in surface analysis for examining interfaces and exploring…

ToF-SIMS Analysis on Insulating Samples
Performing ToF-SIMS analysis on insulating samples can be particularly challenging. Surface…