Posts

photo of ion beam column housing

Ion Beams and their Applications

Ion beams come in many shapes and sizes, with multiple source options and applications. A…
GCIB SEM GCIB 10S gas cluster ion beamIonoptika 2020

GCIB-SEM: 3D electron microscopy with < 10nm isotropic resolution

GCIB-SEM is a new technique that combines high resolution electron microscopy with the damage…
C60 moleculeIonoptika 2020

Why you shouldn’t overlook C60 beams just yet

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C60 cluster ion beams are a fantastic tool for analyzing both hard and soft materials. Composed…

RADIATE: Research And Development with Ion Beams – Advancing Technology in Europe

Ionoptika has joined forces with 14 partners from public research and 3 other SMEs for…
SIMS showing Cr signal of M1.6 screw thread

ToF SIMS of Rough or Uneven Samples

A common problem faced by TOF SIMS analysis is loss of peak resolution and mass accuracy on…
3D SIMS overlay of a single Tetrahymena cell in water ice on a silicon substrate.

Depth Profiling in ToF-SIMS with the J105 SIMS

Depth profiling is a powerful technique in surface analysis for examining interfaces and exploring…
SIMS overlay image of rock surface

ToF-SIMS Analysis on Insulating Samples

Performing ToF-SIMS analysis on insulating samples can be particularly challenging. Surface…