Posts

Analyse v2.0.2.15 Release

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We are happy to announce the release of Analyse v2.0.2.15 for all J105 SIMS customers. This…
Ionoptika 2020

Why you shouldn’t overlook C60 beams just yet

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C60 cluster ion beams are a fantastic tool for analyzing both hard and soft materials. Composed…

How the J105 SIMS works: An introductory guide

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The J105 SIMS is a state-of-the-art 3D imaging ToF SIMS combining innovative design with cutting-edge…

Drug detection with high-sensitivity using ToF SIMS

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The high attrition rate of pharmaceutical drug compounds adds enormously to the cost of those…
Featured ImageIonoptika Ltd 2020

High-resolution molecular imaging ToF SIMS

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Historically ToF SIMS has not been sensitive to intact molecules due to the excessive fragmentation…
SIMS showing Cr signal of M1.6 screw thread

ToF SIMS of Rough or Uneven Samples

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A common problem faced by TOF SIMS analysis is loss of peak resolution and mass accuracy on…

Events

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Ionoptika 2020

J105 SIMS

Unique Analyser The unique buncher-ToF analyser delivers high mass resolution…
IOG-30D Duoplasmatron Ion Beam System
GCIB-40 40kV Gas Cluster Ion Beam System
GCIB-SM 70kV Gas Cluster Ion Beam System
GCIB-SM 70kV Gas Cluster Ion Beam System

Publications

Below are a list of selected publications using Ionoptika equipment 2020 Interrogation…