Posts

photo of ion beam column housing

Ion Beams and their Applications

Ion beams come in many shapes and sizes, with multiple source options and applications. A…
Illustration describing TOF SIMSIonoptika

ToF SIMS – Time of Flight Secondary Ion Mass Spectrometry

/
What is ToF SIMS? What is it used for, and what sort of information can it provide? Which…
Photo of J105 SIMS analysis and prep chambersIonoptika Ltd

How the J105 SIMS works: An introductory guide

/
The J105 SIMS is a state-of-the-art 3D imaging ToF SIMS combining innovative design with cutting-edge…
Ionoptika Ltd

Cocaine metabolite imaging in fingerprints with Water Cluster SIMS

Detection of drug compounds and their metabolites in natural environments is a critical topic…
Picture of a human melanoma cell line growing in tissue culture

High-resolution multi-omics profiling of individual cells

In a landmark publication, Tian et al. demonstrate the feasibility of combined GCIB/C60 SIMS…
GCIB SEM GCIB 10S gas cluster ion beamIonoptika 2020

GCIB-SEM: 3D electron microscopy with < 10nm isotropic resolution

GCIB-SEM is a new technique that combines high resolution electron microscopy with the damage…
C60 moleculeIonoptika 2020

Why you shouldn’t overlook C60 beams just yet

/
C60 cluster ion beams are a fantastic tool for analyzing both hard and soft materials. Composed…

Drug detection with high-sensitivity using ToF SIMS

The high attrition rate of pharmaceutical drug compounds adds enormously to the cost of those…

Employee Spotlight: Dr Naoko Sano

The first to be in the spotlight is one of most recent hires, Dr Naoko Sano, our new Applications Scientist. We asked Naoko about her career and what she enjoys about working at Ionoptika.
Featured ImageIonoptika Ltd 2020

High-resolution molecular imaging ToF SIMS

Historically ToF SIMS has not been sensitive to intact molecules due to the excessive fragmentation…
Cherry blossoms mount fuji

Detecting pollutants in a Cherry Blossom leaf

Plant samples such as leaves are a challenging sample for ToF SIMS. Composed of insulating…
A New Single Ion Implantation Tool

A New Tool for Quantum Device Fabrication

July 10th 2018 — A new single ion implantation tool is launched at the UK National Ion Beam…