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photo of ion beam column housing

Ion Beams and their Applications

Ion beams come in many shapes and sizes, with multiple source options and applications. A…
SIMS showing Cr signal of M1.6 screw thread

ToF SIMS of Rough or Uneven Samples

A common problem faced by TOF SIMS analysis is loss of peak resolution and mass accuracy on…
3D SIMS overlay of a single Tetrahymena cell in water ice on a silicon substrate.

Depth Profiling in ToF-SIMS with the J105 SIMS

Depth profiling is a powerful technique in surface analysis for examining interfaces and exploring…
SIMS overlay image of rock surface

ToF-SIMS Analysis on Insulating Samples

Performing ToF-SIMS analysis on insulating samples can be particularly challenging. Surface…

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IOG C60-40 40kV C60 ion beam systemIonoptika

Publications

Below are a list of selected publications using Ionoptika equipment 2022 Sensitivity…
IOG C60-40 40kV C60 ion beam systemIonoptika