Detecting pollutants in a Cherry Blossom leaf

Plant samples such as leaves are a challenging sample for ToF SIMS. Composed of insulating materials such as cellulose (cell walls) and lipophilic coatings (cuticular layer), charge build up can affect measurement quality. Using an electron gun during analysis can alleviate the charging effect and enables 3D analysis of the surface of a leaf.

Cherry blossom leaves (Prunus serrulata) collected in a busy city were analysed on the J105 SIMS using a 40 kV C60 ion beam. Pieces of blossom leaves were mounted onto double sided tape, attached to a sample stub, and gently pressed down in the corners to ensure best possible contact without deforming the leaf surface. Overview images were acquired on both sides of the leaf surface, with a spatial resolution of 1 µm per pixel and a primary ion dose of 2.2×1013 ions/cm2.

Experimental Conditions

Ion Beam:40kV C60+
Dose:2.2×1013 ions/cm2
Spatial Resolution:1 μm
Charge Compensation:60V Electron Gun, 25V Stage Bias

Without charge compensation, no secondary ions could be detected. Applying an ever-increasing stage bias would produce secondary ions temporarily. Only a combination of charge compensation methods via a 25 V pulsed stage bias and electrons emitted at 60 V beam energy enable us to generate an image of the leaf surface as well as steady signal during depth profiling.

Figure 1. Analysing the surface of a cherry blossom leaf.

Surface analysis reveals the outline of single plant cells. The outlines of the cells contain CaOH (m/z 56.97), while inorganic compounds such as K2O+ (m/z 93.92), Na2Cl+ (m/z 80.95), and Fe+ (m/z 55.93) are unevenly dispersed on the surface of the leaf. All compounds identified across the uneven leaf surface have a mass accuracy < 5 ppm (Table 1).

Analysis also revealed the surface to be coated with an even layer of organic compounds represented by molecules containing aromatic structures, e.g. tropylium ion, C7H7+ (m/z 91.05). Wax coatings on plants take the form of long aliphatic carbon chains, so aromatic structures such as these are unexpected and may indicate the presence of gasoline pollutants such as BTX (benzene, toluene, xylene).

Analysis of complex, insulating, and uneven samples such as these is made routine on the J105 SIMS.

Depth profile analysis reveals that as the cells are etched away, the layer of aromatic compounds reappears on the underside of the sample. Additionally, potassium containing substances are detected that are not present on the surface and only occur within certain cell walls (Figure 1 inset, green).

Imaging depth profile through a leaf showing CaOH (red), K2O (green), and C7H7 (blue).

Repeating the analysis on the lower epidermis reveals a high concentration of aromatic signals surrounding the stomata (Figure 2, green). It is known that plants can absorb pollutants such as BTX, mainly through the stomata, giving further evidence to the origin of these compounds.

Analysis of lower epidermis. Concentration of aromatic signals such as C7H7+ around the stomata may indicate uptake of pollutants such as BTX.

Analysis of complex, insulating, and uneven samples such as these is made routine on the J105 SIMS. Performing high-resolution 3D analysis with high sensitivity creates a more complete picture, enabling a greater understanding of the sample and its environment.

We gratefully acknowledge NESAC/BIO and the University of Washington for the use of their data in this work.

For further information about our instruments or to arrange a demonstration, please get in touch via our Contact page.

EIPBN 2020

We’re delighted to announce that we will be exhibiting at the 64th International Conference on Electron, Ion, and Photon Beam Technology and NanoFabrication (EIPBN) in beautiful New Orleans. This will be our first time at this exciting conference, and we are really looking forward to engaging with a new audience and learning all about their applications.

See you in New Orleans!

BMSS MALDI & Imaging SIG Meeting 2022

We’ll be at Sheffield Hallam University once again for the BMSS MALDI & Imaging SIG Meeting 2022 on May 11th.

This event will showcase the latest advances in MS Imaging, featuring presentations from internationally renowned scientists including Professor Josephine Bunch from The National Physical Laboratory and Professor Simona Francese from Sheffield Hallam University.

Hope to see you there!

68th ASMS Conference on Mass Spectrometry and Allied Topics

We’re excited to be attending the annual ASMS conference once again, this time in Houston, and hope to see you there!

Drop by booth 625 to learn more about how our products can benefit your research!

See you in Houston!

MRS Spring Meeting 2020

We’re excited to be attending the MRS Spring Meeting & Exhibit for the first time. Come by booth 525 to find out how our products can benefit your research. Looking forward to a really good show.

See you in Phoenix!

UKSAF Winter Meeting 2022

The UK Surface Analysis Forum (UKSAF) is a society for scientists from academia and industry with a common interest in the techniques and applications of surface analysis. It meets twice yearly, in January and July, to discuss the latest research and issues of interest to the surface analysis community and to exchange views on current trends. In addition to these regular meetings the group collaborates with other scientific and industrial groups to promote and communicate the vital role played by surface analysis in both industry and academia.

Looking forward to a great meeting.

OurCon VII

We are excited to be a Silver sponsor at the OurCon VII event in St. Malo. The annual OurCon conference is the global forum on mass spectrometry imaging (MSI) research, and we will be on hand to discuss the growing contribution of our J105 SIMS instrument to MSI applications.

BMSS40

Ionoptika will be sponsoring the 2019 Barber Lecture Prize (judged best oral) at the BMSS40 meeting in Manchester. We will also be attending the conference so look forward to seeing you there.

ECASIA 22

We’re excited to be going to ECASIA 22 and the beautiful setting of the University of Limerick.
We look forward to some excellent discussions about all things surface science! Make sure to pop by our exhibition booth and find out all about our latest offerings.

ASMS 2019

Ionoptika will be attending the 67th ASMS Conference on Mass Spectrometry and Allied Topics, held in Atlanta, Georgia, June 2-6 2019.

If you’re planning to be there, please drop by our stand in the exhibition hall and say hello! Looking forward to a productive and informative week.

A New Tool for Quantum Device Fabrication

July 10th 2018 — A new single ion implantation tool is launched at the UK National Ion Beam Centre. Part of a 3 year project between Ionoptika and the University of Surrey and funded by the EPSRC, the new instrument will enable researchers to create new quantum devices faster than ever before.

The instrument, named SIMPLE (Single Ion Multi-species Positioning at Low Energy), was launched during the 16th International Conference on Nuclear Microprobe Technology and Applications (ICNMTA2018) held at the University of Surrey (click here to read the press release).

SIMPLE Instrument

SIMPLE instrument installed at Surrey Ion Beam Centre | Photo courtesy Nathan Cassidy.

Quantum Technology

Quantum mechanics – that fascinating and sometimes bizarre theory governing the world of the very small – has enormous potential to revolutionize many aspects of modern technology. More secure digital communication, “quantum safe” cryptography methods, more accurate time measurements, and faster, more powerful computers are all thought possible.

Quantum computers in particular are an exciting prospect — it’s expected that they will be capable of solving problems not currently feasible even by our most powerful super computers. Actually building a quantum computer, however, remains an hugely ambitious challenge.

One design for a quantum bit, or qubit – the basic building block of a quantum computer – was put forward by Bruce Kane in 1998. It involves embedding pairs of donor atoms, such as phosphorous, very close to one another (~ 20 nm) within a silicon lattice. Known as electron-mediated nuclear spin coupling, the idea has been successfully utilized by researchers to fabricate individual qubits.

Qubit device schematic

Schematic of Kane’s proposed electron-mediated nuclear spin coupling qubit device.

Using a scanning tunneling microscope, researchers carefully placed individual P atoms using an atomically sharp tip and by stimulating chemical reactions on an atom-by-atom basis. An incredibly intricate technique, it can take several days of meticulous preparation to create just a single qubit. A remarkable feat, however a faster, more scalable method is clearly required.

Single Ion Implantation

The SIMPLE project was established with this objective – to develop an instrument platform for the reliable fabrication of arrays of qubits, with high speed and high precision, using single-ion implantation.

A well established technique in the semiconductor industry, the principles of large-scale ion implantation can be applied to implant individual ions when the parameters are very carefully controlled. Leveraging Ionoptika’s expertise in ion beam design and detection, an instrument platform was designed that is capable of producing an array of millions of implanted ions in just a fraction of a second.

The need for new quantum fabrication technologies

The need for new quantum fabrication technologies

 

The instrument comprises a highly focused, sub-20 nm mass-filtered ion column, a nano-precision stage, and high-sensitivity single ion implantation detection system. While detecting single ion events with high enough consistency for wide scale production remains a challenge, progress in this area has been encouraging, and confidence is high that this goal will be met. And when it is, it will mark a world first, and will usher in a new era of quantum computing.

 

The 7th Chinese National Conference on Secondary Ion Mass Spectrometry (SIMS-China VII)

Ionoptika are delighted to announce we are sponsoring the 7th Chinese National Conference on Secondary Ion Mass Spectrometry (SIMS-China VII), which will be held from 9-12th October, 2018, at the Suzhou Institute of Nano-Tech and Nano-Bionics (SINANO), Chinese Academy of Sciences in Suzhou, China. The conference aims to bring together researchers and practitioners from academia and industry to focus on recent advances in SIMS. We look forward to seeing you there!

Conference website