IOE10 Electron Beam System
SED03 Secondary Electron Detection System
RSU2000 Raster Scanning Unit
IGM300 Integrated Imaging System
SIMS showing Cr signal of M1.6 screw thread

ToF SIMS of Rough or Uneven Samples

/
A common problem faced by TOF SIMS analysis is loss of peak resolution and mass accuracy on…
3D SIMS overlay of a single Tetrahymena cell in water ice on a silicon substrate.

Depth Profiling in ToF-SIMS with the J105 SIMS

/
Depth profiling is a powerful technique in surface analysis for examining interfaces and exploring…
SIMS overlay image of rock surface

ToF-SIMS Analysis on Insulating Samples

/
Performing ToF-SIMS analysis on insulating samples can be particularly challenging. Surface…

5th Mass Spectrometry Imaging Symposium – Sheffield Hallam University

/
Ionoptika will be attending the 5th Mass Spectrometry Imaging Symposium at Sheffield Hallam…
IOG C60-40 40kV C60 ion beam systemIonoptika
C60-20 C60 Ion Beam System