IGM300 Integrated Imaging System
SIMS showing Cr signal of M1.6 screw thread

ToF SIMS of Rough or Uneven Samples

A common problem faced by TOF SIMS analysis is loss of peak resolution and mass accuracy on…
3D SIMS overlay of a single Tetrahymena cell in water ice on a silicon substrate.

Depth Profiling in ToF-SIMS with the J105 SIMS

Depth profiling is a powerful technique in surface analysis for examining interfaces and exploring…
SIMS overlay image of rock surface

ToF-SIMS Analysis on Insulating Samples

Performing ToF-SIMS analysis on insulating samples can be particularly challenging. Surface…

5th Mass Spectrometry Imaging Symposium – Sheffield Hallam University

Ionoptika will be attending the 5th Mass Spectrometry Imaging Symposium at Sheffield Hallam…
C60-40 40kV C60 Ion Beam System
C60-20 C60 Ion Beam System