GCIB 10S Webinar in association with UCVAC

On Thursday, in collaboration with UCVAC, we held a webinar on the GCIB 10S Gas Cluster Ion Beam for potential customers in China. The webinar was a great success, and we will certainly look to use this format again to connect with potential customers around the world, particularly while travel restrictions remain in place.

IONOPTIKA recently authorized UCVAC as its sole agent in mainland China and Hong Kong. With extensive experience in the surface science markets, UCVAC are well placed to assist business development and provide technical support in the region. We look forward to working together, and this webinar was a fantastic way to kick things off.

The GCIB 10S is a high-performance gas cluster Ion Beam that delivers rapid, low-damage sputtering for superior quality surface analysis. An ideal upgrade for a variety of instruments, such as XPS, SEM, SPM, and SIMS, the GCIB 10S brings many powerful advantages in an economical, low-maintenance package.

Ultra-low-energy sputtering by argon cluster ions helps to efficiently remove material while producing very low damage and minimal loss of chemical information, leaving a pristine surface for analysis. Removing just a few nanometres per cycle, the GCIB 10S is the ideal tool for achieving ultra-high-resolution depth profile analysis.

If you missed it live, you can watch the full webinar below.