Ion Beams and their Applications
Matt
Ion Beams come in many shapes and sizes, with multiple source options and applications. A minefield of options awaits if you are unfamiliar with them. This application note will shed some light on Ionoptika’s range of Ion Beams to help you choose the right one …
ToF SIMS – Time of Flight Secondary Ion Mass Spectrometry
What is ToF SIMS? What is it used for, and what sort of information can it provide? Which samples are suitable (and which are not)? In this series, we will answer all these questions and more. Time-of-Flight Secondary Ion Mass Spectrometry (ToF SIMS) is a …
How the J105 SIMS works: An introductory guide
The J105 SIMS is a state-of-the-art 3D imaging ToF SIMS combining innovative design with cutting-edge science that has redefined ToF SIMS. Designed to exploit the benefits of cluster Ion Beams, the J105 delivers exceptional sensitivity to molecular ions, 3D MS imaging, and consistent performance across …
High-resolution multi-omics profiling of individual cells
In a landmark publication, Tian et al. demonstrate the feasibility of combined GCIB/C60 SIMS imaging for multi-omics profiling in the same tissue section at the single-cell level. A new approach Multi-omics data are vital to understanding normal regulatory processes and are essential for designing new …
Why you shouldn’t overlook C60 beams just yet
C60 cluster Ion Beams are a fantastic tool for analyzing both hard and soft materials. Composed of sixty carbon atoms arranged into a football shape, C60 ions combine several different features making it a great all-rounder Ion Beam. This is why we always recommend customers …
High-resolution molecular imaging ToF SIMS
Historically ToF SIMS has not been sensitive to intact molecules due to the excessive fragmentation caused by the primary Ion Beam. Now however, thanks to the progress in gas cluster Ion Beam (GCIB) technology over the last decade, sensitivity to intact molecular species in ToF …
Detecting pollutants in a Cherry Blossom leaf
Plant samples such as leaves are a challenging sample for ToF SIMS. Composed of insulating materials such as cellulose (cell walls) and lipophilic coatings (cuticular layer), charge build up can affect measurement quality. Using an electron gun during analysis can alleviate the charging effect and …
ToF SIMS of Rough or Uneven Samples
A common problem faced by TOF SIMS analysis is loss of peak resolution and mass accuracy on samples with rough or uneven topography. The J105 SIMS does not suffer from these issues, experiencing no loss in mass accuracy across even the roughest of samples The …
Depth Profiling in ToF-SIMS with the J105 SIMS
Depth profiling is a powerful technique in surface analysis for examining interfaces and exploring the 3-dimensional structures of a material, to which SIMS is uniquely suited. Many modern instruments are equipped with a sputter Ion Beam in addition to their primary Analysis Beam for depth …
ToF-SIMS Analysis on Insulating Samples
Performing ToF-SIMS analysis on insulating samples can be particularly challenging. Surface charge can impact the accuracy of the results, or in the worst cases prevent any results being obtained. Thanks to its unique ToF design, the J105 SIMS is capable of imaging highly insulating samples …
