Ion Beams and their Applications
Matt
Ion Beams come in many shapes and sizes, with multiple source options and applications. A minefield of options awaits if you are unfamiliar with them. This application note will shed some light on Ionoptika’s range of Ion Beams to help you choose the right one …
GCIB-SEM: 3D electron microscopy with < 10nm isotropic resolution
GCIB-SEM is a new technique that combines high resolution electron microscopy with the damage free sputtering of gas cluster ions to produce incredible 3D tomography with less than 10 nm isotropic resolution. Over the last two decades, Gas Cluster Ion Beams (GCIB) have become increasingly …
Why you shouldn’t overlook C60 beams just yet
C60 cluster Ion Beams are a fantastic tool for analyzing both hard and soft materials. Composed of sixty carbon atoms arranged into a football shape, C60 ions combine several different features making it a great all-rounder Ion Beam. This is why we always recommend customers …
RADIATE: Research And Development with Ion Beams – Advancing Technology in Europe
Ionoptika has joined forces with 14 partners from public research and 3 other SMEs for the RADIATE project, exchanging experience and best practice examples in order to structure the European Research Area of ion technology application. Besides further developing Ion Beam technology and strengthening the …
ToF SIMS of Rough or Uneven Samples
A common problem faced by TOF SIMS analysis is loss of peak resolution and mass accuracy on samples with rough or uneven topography. The J105 SIMS does not suffer from these issues, experiencing no loss in mass accuracy across even the roughest of samples The …
Depth Profiling in ToF-SIMS with the J105 SIMS
Depth profiling is a powerful technique in surface analysis for examining interfaces and exploring the 3-dimensional structures of a material, to which SIMS is uniquely suited. Many modern instruments are equipped with a sputter Ion Beam in addition to their primary Analysis Beam for depth …
ToF-SIMS Analysis on Insulating Samples
Performing ToF-SIMS analysis on insulating samples can be particularly challenging. Surface charge can impact the accuracy of the results, or in the worst cases prevent any results being obtained. Thanks to its unique ToF design, the J105 SIMS is capable of imaging highly insulating samples …
