Ion Beams and their Applications
Matt
Ion Beams come in many shapes and sizes, with multiple source options and applications. A minefield of options awaits if you are unfamiliar with them. This application note will shed some light on Ionoptika’s range of Ion Beams to help you choose the right one …
High-resolution multi-omics profiling of individual cells
In a landmark publication, Tian et al. demonstrate the feasibility of combined GCIB/C60 SIMS imaging for multi-omics profiling in the same tissue section at the single-cell level. A new approach Multi-omics data are vital to understanding normal regulatory processes and are essential for designing new …
Cocaine metabolite imaging in fingerprints with Water Cluster SIMS
Detection of drug compounds and their metabolites in natural environments is a critical topic for both forensic and pharmaceutical applications, and requires overcoming some of the limitations in existing microscopic and analytical techniques. Time of Flight Secondary Ion Mass Spectrometry (ToF SIMS) is a powerful …
GCIB-SEM: 3D electron microscopy with < 10nm isotropic resolution
GCIB-SEM is a new technique that combines high resolution electron microscopy with the damage free sputtering of gas cluster ions to produce incredible 3D tomography with less than 10 nm isotropic resolution. Over the last two decades, Gas Cluster Ion Beams (GCIB) have become increasingly …
GCIB 10S Webinar in association with UCVAC
On Thursday, in collaboration with UCVAC, we held a webinar on the GCIB 10S Gas Cluster Ion Beam for potential customers in China. The webinar was a great success, and we will certainly look to use this format again to connect with potential customers around …
Drug detection with high-sensitivity using ToF SIMS
The high attrition rate of pharmaceutical drug compounds adds enormously to the cost of those that make it to market, so there is an urgent and growing need to identify failure at earlier stages of drug development. In order to do so, researchers require as …
High-resolution molecular imaging ToF SIMS
Historically ToF SIMS has not been sensitive to intact molecules due to the excessive fragmentation caused by the primary Ion Beam. Now however, thanks to the progress in gas cluster Ion Beam (GCIB) technology over the last decade, sensitivity to intact molecular species in ToF …
ToF SIMS of Rough or Uneven Samples
A common problem faced by TOF SIMS analysis is loss of peak resolution and mass accuracy on samples with rough or uneven topography. The J105 SIMS does not suffer from these issues, experiencing no loss in mass accuracy across even the roughest of samples The …
Depth Profiling in ToF-SIMS with the J105 SIMS
Depth profiling is a powerful technique in surface analysis for examining interfaces and exploring the 3-dimensional structures of a material, to which SIMS is uniquely suited. Many modern instruments are equipped with a sputter Ion Beam in addition to their primary Analysis Beam for depth …
ToF-SIMS Analysis on Insulating Samples
Performing ToF-SIMS analysis on insulating samples can be particularly challenging. Surface charge can impact the accuracy of the results, or in the worst cases prevent any results being obtained. Thanks to its unique ToF design, the J105 SIMS is capable of imaging highly insulating samples …
