High-resolution multi-omics profiling of individual cells
Matt
In a landmark publication, Tian et al. demonstrate the feasibility of combined GCIB/C60 SIMS imaging for multi-omics profiling in the same tissue section at the single-cell level. A new approach Multi-omics data are vital to understanding normal regulatory processes and are essential for designing new …
Cocaine metabolite imaging in fingerprints with Water Cluster SIMS
Detection of drug compounds and their metabolites in natural environments is a critical topic for both forensic and pharmaceutical applications, and requires overcoming some of the limitations in existing microscopic and analytical techniques. Time of Flight Secondary Ion Mass Spectrometry (ToF SIMS) is a powerful …
New funding boosts the UK’s future in Quantum manufacturing
Ionoptika Ltd and the University of Surrey have been awarded project grants worth a total of £425,000.00 from Innovate UK, the UK’s innovation agency, to expand their research into new manufacturing technologies for quantum devices. Quantum technologies are expected to create impact across multiple sectors …
Employee Spotlight: Dr Allen Bellew
Ionoptika is very proud of its skilled and dedicated staff, who together with our loyal users make up our global community. In our ongoing series, we shine the spotlight on one of our talented colleagues each month to introduce you to some of the people …
Stigmatic imaging SIMS prototype installed at the University of Oxford
Ionoptika have installed a prototype mass spec instrument at the University of Oxford, marking an exciting development milestone in this project. The prototype, which is a collaboration between the Rosalind Franklin Institute, the University of Oxford, and Ionoptika, is a new design of stigmatic imaging …
Employee Spotlight: Kate McHardy – Head of Sales
Ionoptika is very proud of its skilled and dedicated staff, who together with our loyal users make up our global community. Our new regular post will shine the spotlight on some of the people who make up Ionoptika! This week’s spotlight focuses on Ionoptika’s Head …
Analyse v2.0.2.15 Release
We are happy to announce the release of Analyse v2.0.2.15 for all J105 SIMS customers. This long awaited release brings with it a host of new features as well as several bug fixes. Chief among the new features is a new imzML file converter. To …
Employee Spotlight: Gavyn Trowbridge
This month we move away from new hires to what will be a very familiar face to many of our customers around the world, Senior Test & Service Engineer, Gavyn Trowbridge. …
GCIB-SEM: 3D electron microscopy with < 10nm isotropic resolution
GCIB-SEM is a new technique that combines high resolution electron microscopy with the damage free sputtering of gas cluster ions to produce incredible 3D tomography with less than 10 nm isotropic resolution. Over the last two decades, Gas Cluster Ion Beams (GCIB) have become increasingly …
Why you shouldn’t overlook C60 beams just yet
C60 cluster Ion Beams are a fantastic tool for analyzing both hard and soft materials. Composed of sixty carbon atoms arranged into a football shape, C60 ions combine several different features making it a great all-rounder Ion Beam. This is why we always recommend customers …
