Employee Spotlight: Dr Robert Bianchini – Technical Support Engineer
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Ionoptika is proud of its skilled and dedicated staff and today we're interviewing our customer support agent Dr Robert Bianchini. …
Employee Spotlight: Grace Fox – Software Engineer
Ionoptika is very proud of its skilled and dedicated staff. Today we'd like to introduce our Software Engineer Grace Fox. …
Employee Spotlight: Mark Mills – Senior Scientist
Ionoptika is very proud of its skilled and dedicated staff, who together with our loyal users make up our global community. Today, we talk to our Senior Scientist Mark Mills. …
Employee Spotlight: Dr Gianfranco Aresta – Project Engineer
Ionoptika is very proud of its skilled and dedicated staff. Today, we're introducing Project Engineer Dr Gianfranco Aresta. …
The J105 SIMS at the Rosalind Franklin Institute
One of Ionoptika's J105 SIMS instruments has found its new home at the Rosalind Franklin Institute. Find out about our work together! …
What is Ion Implantation?
Ion implantation is a process whereby dopant ions are accelerated in intense electrical fields to penetrate the surface of a material, thus changing the material’s properties. An essential technique in the semiconductor industry, it is used for modifying the conductivity of a semiconductor during the …
SIMS23 Rowland Hill Awards
The 23rd secondary ion mass spectrometry (SIMS 23) conference was held in Minneapolis, MN, from 18 – 23 September 2022. The biennial event is a forum for colleagues from academic, industrial, and national laboratories worldwide to exchange results and new ideas on Secondary Ion Mass …
Ion Beams and their Applications
Ion Beams come in many shapes and sizes, with multiple source options and applications. A minefield of options awaits if you are unfamiliar with them. This application note will shed some light on Ionoptika’s range of Ion Beams to help you choose the right one …
ToF SIMS – Time of Flight Secondary Ion Mass Spectrometry
What is ToF SIMS? What is it used for, and what sort of information can it provide? Which samples are suitable (and which are not)? In this series, we will answer all these questions and more. Time-of-Flight Secondary Ion Mass Spectrometry (ToF SIMS) is a …
How the J105 SIMS works: An introductory guide
The J105 SIMS is a state-of-the-art 3D imaging ToF SIMS combining innovative design with cutting-edge science that has redefined ToF SIMS. Designed to exploit the benefits of cluster Ion Beams, the J105 delivers exceptional sensitivity to molecular ions, 3D MS imaging, and consistent performance across …
