Picture of a human melanoma cell line growing in tissue culture

High-resolution multi-omics profiling of individual cells

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In a landmark publication, Tian et al. demonstrate the feasibility of combined GCIB/C60 SIMS…
Illustration of a GCIB sputtering material from a surfaceionoptika
Illustration describing TOF SIMSIonoptika

ToF SIMS – Time of Flight Secondary Ion Mass Spectrometry

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What is ToF SIMS? What is it used for, and what sort of information can it provide? Which…
Q-One Ion ColumnIonoptika

New funding boosts the UK’s future in Quantum manufacturing

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Ionoptika Ltd and the University of Surrey have been awarded project grants worth a total…
employee spotlight photo allenIonoptika Ltd

Employee Spotlight: Dr Allen Bellew

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Ionoptika is very proud of its skilled and dedicated staff, who together with our loyal users…
IOG C60-20S ion beamIonoptika 2021

Stigmatic imaging SIMS prototype installed at the University of Oxford

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Ionoptika have installed a prototype mass spec instrument at the University of Oxford, marking…

Employee Spotlight: Kate McHardy – Head of Sales

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Ionoptika is very proud of its skilled and dedicated staff, who together with our loyal users…

Analyse v2.0.2.15 Release

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We are happy to announce the release of Analyse v2.0.2.15 for all J105 SIMS customers. This…
GavynIonoptika 2020

Employee Spotlight: Gavyn Trowbridge

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This month we move away from new hires to what will be a very familiar face to many of our customers around the world, Senior Test & Service Engineer, Gavyn Trowbridge.
GCIB SEM GCIB 10S gas cluster ion beamIonoptika 2020

GCIB-SEM: 3D electron microscopy with < 10nm isotropic resolution

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GCIB-SEM is a new technique that combines high resolution electron microscopy with the damage…
C60 moleculeIonoptika 2020

Why you shouldn’t overlook C60 beams just yet

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C60 cluster ion beams are a fantastic tool for analyzing both hard and soft materials. Composed…