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The 7th Chinese National Conference on Secondary Ion Mass Spectrometry (SIMS-China VII)
Ionoptika are delighted to announce we are sponsoring the 7th Chinese National Conference on Secondary Ion Mass Spectrometry (SIMS-China VII), which will …
ToF SIMS of Rough or Uneven Samples
A common problem faced by TOF SIMS analysis is loss of peak resolution and mass accuracy on samples with rough or uneven …
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Browse our comprehensive collection of papers to find out more about what Ionoptika’s instruments and systems could add to your own research. Follow the link below to view a comprehensive list.
Learn more about the applications of our Ion Beam technology.
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