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ToF SIMS of Rough or Uneven Samples
A common problem faced by TOF SIMS analysis is loss of peak resolution and mass accuracy on samples with rough or uneven …
Depth Profiling in ToF-SIMS with the J105 SIMS
Depth profiling is a powerful technique in surface analysis for examining interfaces and exploring the 3-dimensional structures of a material, to which …
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Browse our comprehensive collection of papers to find out more about what Ionoptika’s instruments and systems could add to your own research. Follow the link below to view a comprehensive list.
Learn more about the applications of our Ion Beam technology.
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