Resources
FIND OUT MORE
Resources
STAY UP TO DATE
Latest News
Keep your finger on the pulse with industry updates, product information, company news, and much more.
Depth Profiling in ToF-SIMS with the J105 SIMS
Depth profiling is a powerful technique in surface analysis for examining interfaces and exploring the 3-dimensional structures of a material, to which …
ToF-SIMS Analysis on Insulating Samples
Performing ToF-SIMS analysis on insulating samples can be particularly challenging. Surface charge can impact the accuracy of the results, or in the …
ACADEMICALLY ACCLAIMED
Publications
Browse our comprehensive collection of papers to find out more about what Ionoptika’s instruments and systems could add to your own research. Follow the link below to view a comprehensive list.
Learn more about the applications of our Ion Beam technology.
JOIN US IN PERSON
Events
From conferences and exhibitions to informative seminars, join us at an event to find out more about what we do.
