UHV Accessories
OPTIMISING YOUR EFFICIENCY
UHV Accessories
WHAT WE DO
Upgrade your systems with innovative UHV accessories.
For over three decades, Ionopitka has been building and designing high-vacuum instrumentation for labs around the world. Now, we offer vacuum accessories to research institutes and manufacturers alike for integration into their own ion imaging systems, low-energy electron beams, and more.
Having the right accessories is crucial.
These critical components enhance your system’s precision, sensitivity, and functionality. This enables advanced imaging, charge neutralisation, and rapid beam control.
When you integrate sophisticated detection systems, scanning controls, and pulsing mechanisms, you can achieve unparalleled performance and versatility for a range of applications.
HIGH DEFINITION IMAGING
Imaging Systems
IGM 300
The IGM 300 is a complete charged particle detection and imaging system. It benefits from beam rastering, a high dynamic range secondary electron/ion detection system, and dedicated software with a range of advanced features.
The IGM 300 comprises the Ionoptika RSU 2000 Raster Scanning System and SED03 Secondary Ion Detector, both of which may also be purchased independently.
RSU 2000
The Raster Scan Unit (RSU) 2000 is a fully integrated beam scanning control package. It is designed for use in conjunction with ion or electron beam systems for imaging, micromachining, and lithography.
Key Features:
- Provides scan outputs for ion or electron columns with adjustable frame rates and pixel densities via software.
- Controls up to three scan outputs simultaneously, each with independent offset, gain, and rotation settings.
- Uses a 25 Mbps isolated digital interface for noise-free communication between the RSU 2000 scan generator and remote scan amplifier.
- Digital I/O supports line/frame sync, start/stop frame triggers, and pixel clocks for easy integration with third-party equipment.
SED03
The Secondary Electron Detector (SED) 03 is a high-gain channeltron-based system. It is designed for the detection of secondary electrons or ions, providing an amplified signal suitable for feeding into an image display system. The system comprises an SED, pre-amplifier, power supply, and cables.
Key Features:
- High gain of up to 6×10^7 @ 3 kV for enhanced detection sensitivity.
- Slim detector for easy integration; custom lengths available.
- Supports both electron and ion detection modes.
- Low noise, high-bandwidth amplifiers ensure effective amplification across frequencies up to TV rate.
- Features anti-aliasing filters, black level clamping, and auto gain control for stable video signals.
- Signal gain and black level controlled via the SED are power supply.
- Includes a current meter with auto-ranging and an analogue output for external connections.
LOW-ENERGY ELECTRON BEAM ACCESSORIES
IOE 10 Electron Beam
IOE 10
The IOE 10 is a low-energy electron beam designed for charge neutralisation in insulating materials. It delivers high current density across a wide energy range, minimising electron-stimulated desorption (ESD) by operating below 40 eV and reducing localised heating. The IOE 10 can be pulsed for TOF SIMS applications and includes quadrupole deflection plates for static positioning or rastering with an external scan system like the RSU 2000.
HIGH SPEED AND EFFICIENCY
PUL 03 Pulser
PUL 03
The PUL 03 is a 10 nanosecond, 400 V pulser designed for quickly blanking / unblanking an Ion Beam system and is an essential accessory to any of our Ion Beams if fast pulsing is needed.
The PUL 03 comprises a control box with a touchpad and LCD display, a 24 V DC power supply and an amplifier that connects directly to the ion column feedthrough. It is designed to drive an open circuit load of 4 to 10 pF capacitance. It is not intended to run into any resistive load or short circuit of less than 10 MΩ.
