SIMS overlay image of rock surface

ToF-SIMS Analysis on Insulating Samples

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Performing ToF-SIMS analysis on insulating samples can be particularly challenging. Surface…

5th Mass Spectrometry Imaging Symposium – Sheffield Hallam University

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Ionoptika will be attending the 5th Mass Spectrometry Imaging Symposium at Sheffield Hallam…
C60-40 40kV C60 Ion Beam System

IOG C60-40

C60-20 C60 Ion Beam System

IOG C60-20

C60-10 C60 Ion Beam System

IOG C60-10

< 1 mm[/av_cell][/av_row] [av_row row_style=''][av_cell col_style='']Column Isolation[/av_cell][av_cell…