https://ionoptika.com/wp-content/uploads/2018/02/GCIB-SM_thumb.jpg800990webmasterhttps://ionoptika.com/wp-content/uploads/2018/06/IO_logo_black_700x322.pngwebmaster2018-02-19 09:46:372021-06-23 10:38:54GCIB SM
A common problem faced by TOF SIMS analysis is loss of peak resolution and mass accuracy on…
https://ionoptika.com/wp-content/uploads/2018/02/screwthread_big-1.jpg321700webmasterhttps://ionoptika.com/wp-content/uploads/2018/06/IO_logo_black_700x322.pngwebmaster2018-02-06 16:14:402022-12-05 16:13:16ToF SIMS of Rough or Uneven Samples
Depth profiling is a powerful technique in surface analysis for examining interfaces and exploring…
https://ionoptika.com/wp-content/uploads/2018/02/depth_post_big.jpg321700webmasterhttps://ionoptika.com/wp-content/uploads/2018/06/IO_logo_black_700x322.pngwebmaster2018-02-06 15:38:592022-12-05 16:13:29Depth Profiling in ToF-SIMS with the J105 SIMS
IOG 25AU
GCIB 40
GCIB SM
GCIB 10S
PUL 03
IOE 10
SED 03
RSU 2000
IGM 300
ToF SIMS of Rough or Uneven Samples
Depth Profiling in ToF-SIMS with the J105 SIMS
ToF-SIMS Analysis on Insulating Samples