News
STAY UP TO DATE
News
Here, you’ll find everything from cutting-edge product developments to company announcements and industry insights. Stay informed on how we’re shaping the future of Ion Beam technology, and contributing to materials, life science and quantum research across the world.
Stigmatic imaging SIMS prototype installed at the University of Oxford
Ionoptika have installed a prototype mass spec instrument at the University of Oxford, marking an exciting development milestone …
Employee Spotlight: Kate McHardy – Head of Sales
Ionoptika is very proud of its skilled and dedicated staff, who together with our loyal users make up …
Analyse v2.0.2.15 Release
We are happy to announce the release of Analyse v2.0.2.15 for all J105 SIMS customers. This long awaited …
GCIB-SEM: 3D electron microscopy with < 10nm isotropic resolution
GCIB-SEM is a new technique that combines high resolution electron microscopy with the damage free sputtering of gas …
Why you shouldn’t overlook C60 beams just yet
C60 cluster Ion Beams are a fantastic tool for analyzing both hard and soft materials. Composed of sixty …
GCIB 10S Webinar in association with UCVAC
On Thursday, in collaboration with UCVAC, we held a webinar on the GCIB 10S Gas Cluster Ion Beam …
