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Analyse v2.0.2.15 Release
We are happy to announce the release of Analyse v2.0.2.15 for all J105 SIMS customers. This long awaited release brings with it …
GCIB-SEM: 3D electron microscopy with < 10nm isotropic resolution
GCIB-SEM is a new technique that combines high resolution electron microscopy with the damage free sputtering of gas cluster ions to produce …
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Browse our comprehensive collection of papers to find out more about what Ionoptika’s instruments and systems could add to your own research. Follow the link below to view a comprehensive list.
Learn more about the applications of our Ion Beam technology.
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