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ToF SIMS – Time of Flight Secondary Ion Mass Spectrometry
What is ToF SIMS? What is it used for, and what sort of information can it provide? Which samples are suitable (and …
How the J105 SIMS works: An introductory guide
The J105 SIMS is a state-of-the-art 3D imaging ToF SIMS combining innovative design with cutting-edge science that has redefined ToF SIMS. Designed …
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Browse our comprehensive collection of papers to find out more about what Ionoptika’s instruments and systems could add to your own research. Follow the link below to view a comprehensive list.
Learn more about the applications of our Ion Beam technology.
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