Ion Beams and their Applications
Ion beams come in many shapes and sizes, with multiple source options and applications. A minefield of options awaits if you are unfamiliar with them. This application note will shed some light on Ionoptika’s range of ion beams to help you choose the right one for your application.
Contents
- Sputter vs Analytical Ion Beams
- C60 Beams
- Gas Cluster Ion Beams
- Liquid Metal Ion Beams
- Plasma Ion Beams
- Conclusions
Sputter vs Analytical Ion Beams
We split our range of ion beams into two groups based on their applications or purpose – sputter beams and analytical beams.
Sputter Beams
While all ion beams will sputter a surface, we make this distinction based on the area and speed with which this occurs. Sputter beams have three characteristic features: high current, large spot size, and wide field of view. They deliver a large dose of ions over a wide area as quickly as possible to optimise etch rates.
Sputter beams remove material before analysis, either for cleaning purposes or for depth profiling through the sample. Techniques employing sputter beams include SIMS, XPS, SEM, TEM, and Auger.
Analytical Beams
Rather than being used to facilitate analysis using a different technique, analytical beams perform the analysis themselves. They also have three characteristic features; wide energy range, small spot size, and variable current control. These features give the user excellent control over the beam characteristics, enabling them to optimise their experiment.
Analytical beams are primarily used for secondary ion mass spectrometry (SIMS) and work well in traditional focused ion beam (FIB) applications such as secondary electron imaging and FIB milling.
C60 Beams
Carbon-60, or just C60, is a fullerene molecule consisting of sixty carbon atoms formed into a hollow sphere, with a shape very similar to a soccer ball. The first commercial C60 ion beam was produced in 2002 by Ionoptika in collaboration with the University of Manchester, and since then, we have sold more than 150 units worldwide.
Compared to monatomic ion beams, C60 beams result in a much “gentler” sputtering action, reducing molecular fragmentation and damage to sub-surface layers. When employed as an analytical beam, this gentle sputtering action significantly increases sensitivity to intact molecular ions.
As the C60 molecule is larger (~ 7 Å) than the lattice constant for most materials, it also does not channel through the lattice the way monatomic ions do, reducing preferential sputtering. C60 beams exhibit incredibly uniform sputter rates across a wide range of materials, including challenging poly-crystalline materials.
The properties of C60 make it suitable for both sputtering and analysis. Ionoptika offers three C60 ion beam systems: a broad-beam sputtering system, the C60-20S, and two analytical beams, the C60-20 and C60-40.
See our application note all about C60 beams for more information.
Gas Cluster Ion Beams
Gas cluster ion beams (GCIB) are high-energy beams of cluster ions, ideal for sputtering and analysing organic matter. GCIBs are an incredibly versatile ion source, as both the ion species and the beam properties can be varied, allowing the user to tune the beam to the needs of their experiment.
The source operates through the adiabatic expansion of gas in a vacuum, causing rapid cooling and cluster formation. The clusters are then ionised through electron bombardment and accelerated towards the target. The size of the cluster is a vital parameter, and users can adjust this over a wide range.
Organic Analysis
GCIBs are the ideal choice for sputtering organic matter. Etch rates of organic matter are orders of magnitude higher than for metals or semiconductors, making cluster beams such as the GCIB 10S an excellent tool for surface cleaning. The cluster distributes the ion’s energy across all constituent atoms/molecules, resulting in a very gentle sputtering effect and almost no damage to layers underneath—GCIBs perform much better than C60 on both fronts.
GCIBs must be operated at high energy to maximise their benefits for SIMS, as the secondary ion yield increases as a function of beam energy. We currently offer a 40kV variant, the GCIB 40, and a 70kV variant, the GCIB SM.
The J105 SIMS utilises the benefits of gas cluster beams for organic analysis. Combining the gentle sputter action of large cluster ions with increased secondary ion yield has extended the usable mass range to > m/z 2500.
Choice of gas
The versatility of GCIBs comes from having a choice of input gas. Argon is the most common as it is an inert gas that forms clusters easily, but Ar/CO2 mixtures and pure CO2 gas are also becoming standard for SIMS applications.
The stronger van der Waals forces between CO2 molecules result in much larger clusters than would be available for Ar – up to 20,000 in some cases. A wider range provides greater control of the all-important E/n value (energy per nucleon). Research has shown that optimising E/n results in an enhancement of the secondary ion signal. The presence of O– ions at the surface may also improve the ionisation probability – further enhancing ion yield.
We have recently developed a GCIB source that runs on water vapour, which is currently available as an optional add-on for the J105 SIMS. Water molecules have even greater binding energy and can form enormous clusters of up to 60,000 molecules. Water clusters provide secondary ion yields up to 500 times greater than argon and are the best choice for state-of-the-art biological SIMS.
See our application note on choosing the best GCIB for your application for more detailed information.
Liquid Metal Ion Beams
Liquid metal ion beams, also known as LMIS, or LMIG, are a well-established source technology. The source operates by a liquid metal reservoir feeding a blunt tungsten tip, from which a strong electric field extracts ions. Due to their elegant and reliable design, FIB systems have been using LMIS for decades. Ionoptika offers a 25 kV LMIG system in two variants; the IOG 25AU gold-cluster system and the IOG 25GA gallium system.
Liquid metal beams produce monatomic or small-cluster ion beams, such as Au+, Ga+, and Au3+. They feature high currents and small spot sizes (< 100 nm), making them ideal for high-resolution analysis applications.
Small, high-energy ions can penetrate far beneath the surface before dissipating their energy. Known as channelling, this causes significant sub-surface damage, making depth profiling unreliable. It also results in considerable fragmentation, making LMIS more suited to analysing hard materials.
Plasma Ion Beams
Plasma ion sources are characterised by incredibly high brightness, making them ideal for high throughput applications. A single plasma source can run on various gases without changing parts, providing flexibility. Gases available for our plasma ion beams include hydrogen, helium, oxygen, nitrogen, argon, and xenon.
Plasma sources are monatomic and do not form clusters, resulting in lower energy distributions and smaller spot sizes. Combined with their high brightness, this leads to a very high current density beam.
Plasma beams are an excellent choice where the primary goal is high-volume etching or milling. For analysis purposes, plasma beams best suit harder materials such as metals, semiconductors, and inorganics.
FLIG – Floating Low Energy Ion Beam
The FLIG 5 is a unique ion beam system based on a floating column design. The design enables ultra-low energy operation to 200 eV while still delivering a high current. Operating at such low impact energies significantly reduces the beam’s penetration depth, improving the depth resolution. Due to its high performance at ultra-low energies, the FLIG 5 has been the industry standard for shallow junction depth profiling for almost two decades.
Conclusion
The table below compares Ionoptika’s ion beam products under several categories discussed in this article (best viewed on desktop).
| ION BEAM | SPECIES | ENERGY RANGE | MIN SPOT SIZE | BEAM CURRENT | APPLICATION | BEST FOR | |
|---|---|---|---|---|---|---|---|
| C60 Ion Beams | |||||||
| C60-20S | C60+, C60++, C60+++ | 5 – 20 kV | 100 μm | 50 nA | SPUTTER | Organic, biological, inorganic, metals | |
| C60-20 | C60+, C60++, C60+++ | 5 –20 kV | 2 μm | 2 nA | ANALYTICAL | Organic, biological, inorganic, metals | |
| C60-40 | C60+, C60++, C60+++ | 10 – 40 kV | 300 nm | 1 nA | ANALYTICAL | Organic, biological, inorganic, metals | |
| Gas Cluster Ion Beams | |||||||
| GCIB 10S | Arn+, (CO2)n+, or (Ar/CO2)n+ | 1 – 10 kV | 250 μm | 60 nA | SPUTTER | Organic & biological, polymers | |
| GCIB 40 | Arn+, (CO2)n+, (Ar/CO2)n+, or (H2O)n+ | 5 – 40 kV | 3 μm | 200 pA | ANALYTICAL | Organic & biological, polymers | |
| GCIB 70/SM | Arn+, (CO2)n+, (Ar/CO2)n+, or (H2O)n+ | 20 – 70 kV | 1.5 μm | 300 pA | ANALYTICAL | Inorganic, organic & biological, polymers | |
| Liquid Metal Ion Beams | |||||||
| IOG 25AU | Au+, Au++, Au2+, Au3+, Au3++ | 5 – 25 kV | 100 nm | 10 nA | ANALYTICAL | Inorganics, metals, semiconductors | |
| IOG 25Ga | Ga+, 69Ga+ | 5 – 25 kV | 50 nm | 20 nA | ANALYTICAL | Inorganics, metals, semiconductors | |
| Plasma Ion Beams | |||||||
| IOG 30ECR | N2+, O2+, Ar+, & Xe+ | 5 – 30 kV | 500 nm | 500 nA | ANALYTICAL | Semiconductors, metals, inorganics | |
| IOG 30D | H2+, He+, N2+, O2+, & Ar+ | 5 – 30 kV | 500 nm | 500 nA | ANALYTICAL | Semiconductors, metals, inorganics | |
| FLIG 5 | H2+, He+, N2+, O2+, & Ar+ | 0.2 – 5 kV | 15 μm | 500 nA | ANALYTICAL | Semiconductors, depth profiling | |
ToF SIMS – Time of Flight Secondary Ion Mass Spectrometry
What is ToF SIMS? What is it used for, and what sort of information can it provide? Which samples are suitable (and which are not)? In this series, we will answer all these questions and more.
Time-of-Flight Secondary Ion Mass Spectrometry (ToF SIMS) is a surface analysis technique used to study the chemical composition of solid surfaces and thin films in three dimensions.
A focused beam of primary ions bombards a target surface, creating a plume of neutral atoms/molecules, secondary ions, and electrons. The secondary ions are collected and analysed using a time-of-flight mass spectrometer. The mass spectrometer measures an ion’s mass-to-charge ratio (m/z) by precisely timing how long it takes to reach the detector – the “time of flight”.
By scanning the primary ion beam across an area of the sample, a chemical map of the surface is formed pixel by pixel. Scientists and technicians use ToF SIMS daily for fundamental research, routine analysis, and quality control in academic and industrial settings.
For many years, the limitations of the primary ion beam confined the analysis to looking at atomic species and small molecules. With advances in instrument and ion beam design, modern instruments such as the J105 SIMS are now routinely imaging large intact molecules. These new capabilities have caused an explosion in new applications, and more papers are published each year in bio and bio-related fields using ToF SIMS.
Anatomy of a ToF SIMS instrument
ToF SIMS instruments are often larger and more expensive than most other analytical instruments found in a lab. High-vacuum conditions (< 1×10-6 mbar) are required to prevent ions from colliding with gas molecules in the air, requiring bigger vacuum pumps, more robust seals, and additional precautions to prevent leaks.
| Primary components | Secondary components |
|---|---|
| Sample analysis chamber (SAC) | Sample introduction System |
| Primary ion beam | Cryogenic cooling for low-temperature analysis |
| Secondary ion extraction optics | Charge compensation, e.g., electron beam |
| Mass spectrometer | Secondary electron imaging |
Key Benefits of ToF SIMS
- Spatial resolution. ToF SIMS achieves significantly higher spatial resolutions than other imaging methods, thanks to beam sizes as small as a few hundred nanometres.
- Speed. The time-of-flight mass spectrometer operates at much higher rates than other MS techniques. ToF SIMS instruments can run at speeds up to 1000 pixels per second.
- 3D imaging. The primary ion beam removes a small amount of material each time it scans across the surface. By making multiple passes over the same area, a 3D map of the material builds up layer by layer.
- Sensitivity. Small spot sizes and shallow impact craters result in tiny analysis volumes, which require great care to prevent signal loss. As a result, SIMS is generally more sensitive than other forms of mass spectrometry.
- Dynamic range. The ions in a ToF SIMS spectrum can range from a single hydrogen ion to intact protein molecules several thousand daltons in size.
- Applications. The breadth of applications for ToF SIMS is enormous, ranging from metallurgy to fundamental biology and most things in-between.
Applications of ToF SIMS
ToF SIMS provides a detailed three-dimensional chemical map of a sample. Information about the atoms and molecules that make up the sample, their distribution, and any contamination present are all revealed. This type of information is beneficial for many applications.
Academic research labs, industrial quality control, and research organisations use ToF SIMS daily. Disciplines as diverse as materials science, analytical chemistry, biology, geology, pharmaceutical science, and many others benefit from the detailed chemical information ToF SIMS provides.
2D Imaging
2D images are the most common mode of operation for ToF SIMS applications, whereby the ion beam scans the surface, acquiring a mass spectrum at each pixel. The image resolution can vary from a few hundred pixels to over four million.
Images of individual mass channels show the precise distribution of ions across the field of view. Overlaying multiple mass channels can show the distribution of different ions and how they relate to each other.
The image below shows three individual ion images and an overlay image representing different components of a biological tissue sample.
Spectrometry
Analysis of a ToF SIMS spectrum provides information on the atomic or molecular makeup of the sample and can inform about the general abundance of various compounds. It is also possible to determine atomic ratios in some cases, but this requires well-controlled samples and careful use of reference materials.
Tandem mass spectrometry is a feature on most major ToF SIMS instruments and is extremely useful for confidently identifying ions. Tandem MS, also known as MS/MS, or MS2, involves isolating a secondary ion of interest, fragmenting it, and collecting the resulting fragments in a mass spectrum. By analysing the daughter peaks, it is possible to determine the parent ion with a high level of precision.
Depth profiling
A powerful analysis mode, depth profiling involves etching vertically through the sample and acquiring a mass spectrum at every layer. The result is a profile of all atoms/molecules through the sampled volume. Large cluster ions reduce damage to sub-surface layers, minimising interlayer mixing and maximising depth resolution. With the right ion beam and sample combination, depth resolution as low as a few nanometres is possible.
Depth profile through the NIST Ni/Cr standard reference material using a C60 beam, showing 5 nm depth resolution.
3D Imaging
The feature that sets ToF SIMS apart from other mass spectrometry and analytical techniques is the ability to acquire 3D data sets. Like a depth profile, a 3D analysis involves acquiring many 2D layers repeatedly over the same area, etching material with each pass, and building up a three-dimensional view of the sample. Large cluster ions are ideal for 3D analysis as they produce very little damage and can therefore be used to etch and analyse the sample simultaneously.
Unlike techniques like AFM, which capture the 3D topography of the sample, SIMS cannot distinguish 3D objects from flat objects. The technique works best for flat samples with layers of interest below the surface, as in the OLED example below. It is possible to reconstruct the topography of a non-flat sample; however, this requires prior knowledge of the material structure.
Read more about the applications of ToF SIMS in our Application Notes section. Or, to dive deeper into more advanced topics, check out the list of publications using our equipment here. You might also like to learn more about how the J105 SIMS operates, which you can read here.
How the J105 SIMS works: An introductory guide
The J105 SIMS is a state-of-the-art 3D imaging ToF SIMS combining innovative design with cutting-edge science that has redefined ToF SIMS. Designed to exploit the benefits of cluster ion beams, the J105 delivers exceptional sensitivity to molecular ions, 3D MS imaging, and consistent performance across all samples.
In this article, we aim to give you an overview of how the J105 SIMS works, as it is quite different to other ToF SIMS. We will guide you through the various features of the instrument and explain their purpose, how they work, and what the benefits are.
1. The Ion Beam
The J105 was designed to get around many of the limitations faced by traditional ToF SIMS instruments, particularly for biological samples. One of the ways this is achieved is by not pulsing the primary ion beam, but instead running it in DC, or continuous mode. This is a major advantage and is what makes the J105 a very different instrument to most other ToF SIMS.
One of the biggest advantages of having a continuous beam is that any ion beam, no matter what size, can be used as the primary source. This gives the user a lot of choice when designing their experiment. We’ll cover the intricacies of different ion beams in a different article, but for the purposes of this discussion we’ll focus on gas cluster ion beams (GCIB).
A GCIB typically consists of thousands of constituent atoms, giving it a collective molecular weight anywhere from 100,000 g/mol upwards. Under typical acceleration voltages (kV), such a large ion moves very slowly, requiring longer pulses and on a conventional ToF would result in poor mass resolution. By running in continuous (or long pulsing) mode, the J105 is able to get around this issue and take full advantage of the benefits of using GCIBs.
The other major advantage of running in DC mode is that focusing the ion beam to a fine spot can be prioritized without affecting the performance of the mass spectrometer. With our most powerful GCIB, the GCIB SM, the optics have been designed to enable spot sizes of just 1.5 µm, combining greater spatial resolution with high-sensitivity mass spectrometry. The benefits of this are clear, and have been highlighted recently by the pioneering work published in Science.
Benefits: Simultaneous high-sensitivity mass spectrometry with high-spatial resolution.
2. The Extraction Optics
As the primary beam is not pulsed, in order to determine a time-of-flight the secondary ion beam is pulsed instead. This is done by the Buncher, but the extraction optics play a key role is controlling the secondary ion beam prior to that step.
Secondary ions extracted from the surface contain a lot of energy making them difficult to control. In order to form the secondary ions into a controlled beam, they enter an RF quadrupole filled with N2, which slows the ions down through the process of collisional cooling.
This is a crucial step, as it decouples the effects of the primary beam and the sample from the secondary ions. By effectively wiping the memory of any interaction on the surface, this step enables the J105 to analyse samples with complex topography without any loss of mass spec performance.
Benefits: Consistent performance that is independent of ion beam or sample topography.
3. The Buncher
In many ways the heart of the instrument, the Buncher is what takes a continuous stream of secondary ions coming from the quad and forms them into a very short pulse. In order to measure the time-of-flight without pulsing the primary beam or the extraction, the Buncher creates an asymmetric pulse that focuses all ions of the same mass to a single time focus, T0. This is an essential step, and is what ultimately determines the mass resolution.
Benefits: High mass accuracy, high mass resolution.
4. Tandem MS & Time-of-Flight
As with any form of mass spectrometry, definitively assigning peaks requires a secondary validation step. One way to do this is through tandem MS, whereby a parent ion is selected to undergo fragmentation and the resulting spectrum is used to determine the exact form of the parent. The J105 SIMS was the first SIMS instrument to introduce tandem MS, and is included as standard on all our instruments.
When a user selects an ion of interest, it is directed into a high-energy collision cell filled with N2, producing characteristic fragment ions. Whether running an MS1 or MS2 experiment, ions then enter the 1500 mm long reflectron before being detected.
Benefits: Tandem MS for accurate peak identification, high mass resolution.
The J105 SIMS contains several innovative design features that combine to produce an instrument like no other, optimized to enable both maximum sensitivity and maximum spatial resolution simultaneously from any ion beam. Consistent performance is guaranteed, as the mass spectrometer delivers high mass resolution (> 10,000) and mass accuracy (< 5 ppm) that are completely independent of the ion beam and the sample environment.
The J105 SIMS is the ideal tool for a wide range of applications and sample types, including biological research, pharmaceuticals, thin films, polymers, energy applications and many more. To find out if the J105 might be the right instrument for you, or to arrange a demonstration, please get in touch via our Contact Page.
High-resolution multi-omics profiling of individual cells
In a landmark publication, Tian et al. demonstrate the feasibility of combined GCIB/C60 SIMS imaging for multi-omics profiling in the same tissue section at the single-cell level.
A new approach
Multi-omics data are vital to understanding normal regulatory processes and are essential for designing new anti-cancer modalities. Unfortunately, sample preparation methods between different omics are typically incompatible. As such, it is nearly impossible to correlate multiple omics profiles within the same sample, let alone their spatial co-localisation at the single-cell level.
The new approach developed by Tian et al. thus represents a significant leap forward.
The study, reported in the journal Analytical Chemistry, uses a multimodal approach using the J105 SIMS to correlate different cell types. First, water cluster SIMS maps the lipids and metabolites in individual cells. Then, multiplexed SIMS imaging with a high-resolution C60 beam maps the same tissue section stained by lanthanide tagged antibodies.
Multiplexed SIMS imaging involves linking specific lanthanide isotopes to antibodies and applying them to the tissue. Subsequent SIMS imaging of the lanthanides maps multiple cellular epitopes at sub-cellular resolution.
The combined approach of water cluster SIMS plus multiplexed ion beam imaging on the same tissue section enables mapping lipids, proteins, and metabolites at the single-cell level.
High-resolution multi-omics
Cryogenic water cluster SIMS was conducted on the J105 SIMS at 1.6-micron beam spot size on fresh frozen sections of invasive ductal carcinoma/ductal carcinoma in situ (IDC/DCIS) tissue. This analysis was followed by staining with lanthanide-tagged antibodies on the same frozen-hydrated tissue and imaging the same region using a C60 beam with a 1.1 µm spot size.
The first results
Water cluster SIMS revealed the distributions and intensities of more than 150 lipids and important metabolites up to m/z 2000. HCA analysis revealed considerable variation between the location of cluster SIMS identified ions and the nine C60-SIMS cell markers.
This work represents the first successful attempt to profile proteins, lipids, and metabolites on the same tissue at the single-cell level. GCIB-SIMS, especially water clusters, has demonstrated its unique ability to detect lipids and metabolites in biological samples at unprecedented resolutions.
Using a combined SIMS imaging approach enables the correlation of different cell types with their metabolic and lipidomic status. It offers valuable information about proteins, lipids, and metabolites on the same sample and at the same resolution.
The J105 SIMS provides a unique platform for this multimodal SIMS approach. The only instrument to offer water cluster SIMS plus multiplexed ion beam imaging, the J105 also provides high mass accuracy and tandem MS capabilities for accurate ion assignment.
Read the complete publication here.
Experience the capabilities of the J105 SIMS for yourself by booking a demonstration. Get in touch with our sales team today to organise your demo.
Cocaine metabolite imaging in fingerprints with Water Cluster SIMS
Detection of drug compounds and their metabolites in natural environments is a critical topic for both forensic and pharmaceutical applications, and requires overcoming some of the limitations in existing microscopic and analytical techniques.
Time of Flight Secondary Ion Mass Spectrometry (ToF SIMS) is a powerful analytical technique capable of providing detailed chemical and spatial information about a surface, and as such has recently been employed in a number of forensic studies for drug and metabolite detection. However, ToF SIMS can suffer from low sensitivity due to insufficient ionisation efficiency, and this is particularly true for complex biomaterials, i.e. those of most interest to forensic and medical analysts.
Recently, we have led the development of a powerful unique gas cluster ion beam (GCIB) using water clusters. The Water Cluster Source is capable of enhancing ion yields by many orders of magnitude compared to other conventional ion beams (C60+, Bi3+ etc.), and is particularly effective for biomolecular imaging and 3D analysis of organics such as tissue, cells, fingerprints, etc.
In this application note, an experimental fingerprint detection approach using the Water Cluster Source identifies traces of ingested cocaine on human skin. The use of the J105 SIMS equipped with the Water Cluster Source (Water Cluster SIMS) provides both visualisation of the latent fingerprint as well as discrimination between contact-only and ingested cocaine by looking for metabolites of the drug excreted through the skin.
Detectable levels of metabolite in a fingerprint are extremely low, for instance 25 mg of ingested cocaine excretes less than 2.5 ng/mL in sweat,1 and previous attempts using other mass spectrometry imaging (MSI) techniques such as MALDI and DESI were unsuccessful. Using Water Cluster SIMS, it was possible not only to detect the metabolite, but also to generate a high-contrast chemical map of the entire fingerprint.
The fingerprint specimen, provided by University of Surrey, was collected on a piece of silicon wafer from a donor who had previously ingested cocaine,2 then a ToF-SIMS analysis was acquired on an 18×6 mm2 area with a 70 kV (H2O)29k+ primary ion beam in the J105 SIMS.
Figure 1(a) shows the chemical image of the 290.14 m/z signal, demonstrating the characteristic fingerprint features with ridges, valleys, as well as sweat pores. Due to the high mass accuracy of the J105 SIMS, this signal is confidently annotated as the cocaine metabolite benzoylecgonine (BZE, C16H20NO4+). Figure 1(b) shows a colour overlay of BZE (magenta) and the cocaine molecular ion (C17H22NO4+, 304.15 m/z – yellow). As expected, cocaine was observed in particulate form (see arrow) due to direct contact of the donor with the powder, and is not co-localised with BZE.
These images, with the small amounts of BZE and cocaine present, demonstrate the benefits of Water Cluster SIMS for enhancing sensitivity, particularly for trace detection of organic compounds in complex sample matrixes.
The J105 SIMS is a powerful tool for 2D and 3D molecular imaging, providing high sensitivity analysis with a range of powerful features. Now featuring the new Water Cluster Source, the J105 takes another leap forward to offer even greater sensitivity and to intact molecular ions. This exciting new technology has been shown to dramatically improve the imaging of drug metabolites ingested by the body, and is a powerful tool for visualising molecular information in a wide range of applications.
To find out more about how the J105 SIMS can benefit your research, get in touch via our Contact Page.
References
- Kacinko, S. L., Barnes, A.J. et al. , Disposition of Cocaine and Its Metabolites in Human Sweat after Controlled Cocaine Administration, Clinical Chemistry, 51, 2085 (2005). https://doi.org/10.1373/clinchem.2005.054338
- Jang, M., Costa, C., Bunch, J. et al. On the relevance of cocaine detection in a fingerprint. Sci Rep 10, 1974 (2020). https://doi.org/10.1038/s41598-020-58856-0
New funding boosts the UK’s future in Quantum manufacturing
Ionoptika Ltd and the University of Surrey have been awarded project grants worth a total of £425,000.00 from Innovate UK, the UK’s innovation agency, to expand their research into new manufacturing technologies for quantum devices.
Quantum technologies are expected to create impact across multiple sectors from more secure online communications to personalised medicine. However, to date only a handful of companies, such as IBM and Google, have successfully built a basic quantum computer because of the extreme challenges to manufacture and operate these devices. This new Innovate grant will open up new scalable manufacturing methods to researchers in the UK and around the world.
The project, entitled “Rapid and Scalable Single Colour-Centre Implantation for Single Photon Sources”, was recommended for funding by a panel of independent assessors, who concluded that “This is an innovative project by two expert partners. If it is successful, it will lead to a unique product that may possibly revolutionise quantum computing.”
Ionoptika Ltd, together with the University of Surrey, will use beams of ionised atoms to create quantum devices one at a time using rare earth elements such as erbium and ytterbium. Ion beams are used widely in the scientific and manufacturing sectors, from the production of computer chips to medical diagnostic instrumentation and cancer treatment.
The technique, known as ion implantation, has been used for decades to make modern computer chips and benefits from being much quicker than other manufacturing methods. The main limitation of the technique for quantum applications has been the inability to precisely control the location and numbers of implanted ions at the single-ion level. The new tool from Ionoptika, called Q-One, solves this problem yet is still fast enough to implant one thousand quantum bits (qubits) every second.
The funding comes on the back of $1.3bn in UK government funding allocated for quantum technologies research.1 It is expected to help Ionoptika expand, creating 20+ highly skilled STEM jobs in the Southampton area over the next 5-10 years, and injecting £6m+ into the UK engineering supply chain.
Paul Blenkinsopp, Managing Director at Ionoptika, commented, “Quantum technologies are set to drive the next generation of innovation and technologies. Ionoptika is delighted to be working with the University of Surrey on developing the tools and infrastructure that will be needed to realise many of these exciting quantum applications.”
Dr David Cox, from the University of Surrey, added, “The University of Surrey through the National Ion Beam Centre is delighted to work on this project with Ionoptika. The ability to precisely control the implantation of ions at the single-atom level offers enormous potential to the newly emerging quantum technologies that are set to revolutionise the world.”
Press release: pressat.co.uk/releases/new-funding-boosts-the-uks-future-in-quantum-manufacturing-766391c0ab7bf7129d63a0993739e010/
Ionoptika, a UK SME based in Chandler’s Ford, Hampshire, has driven innovation in scientific instrumentation for 27 years. Manufacturing state-of-the-art ion beam systems for labs around the world, they have contributed to research from fields as diverse as cancer research to quantum computers. For more information visit www.ionoptika.com.
1https://www.qureca.com/overview-on-quantum-initiatives-worldwide-update-mid-2021/
Employee Spotlight: Dr Allen Bellew
Ionoptika is very proud of its skilled and dedicated staff, who together with our loyal users make up our global community. In our ongoing series, we shine the spotlight on one of our talented colleagues each month to introduce you to some of the people behind Ionoptika.
Our latest spotlight focuses on Dr Allen Bellew, our Marketing & Applications Manager. You can find Allen giving talks or manning the booth for Ionoptika at trade shows and exhibits around the world. We asked Allen for an insight into his time at Ionoptika.
Why did you decide to study science when you were at school or university?
I’ve loved science ever since I was young and always wanted to be involved in discovering something new about the world. I did as many science subjects as I could at school and always knew that’s what I would study at university. I ended up doing Physics and Chemistry at Trinity College Dublin – I could never decide which discipline was my favourite, so finding a course that did both was perfect for me.
How long have you worked at Ionoptika and what career path brought you to us?
I joined Ionoptika as a Test Engineer in 2016 and have worked in several roles since then including Technical Sales. Before joining Ionoptika I got my PhD in Nanoscience from Trinity College Dublin. I then worked as staff in the Advanced Microscopy Lab at the University managing their Helium Ion Microscope and lithography facilities. I find that having that background as a user of this type of equipment helps me to connect with the needs of our customers and deliver the best service for them.
Our customers are involved in so many different areas of research, from ground-breaking cancer research to building quantum computers, and they are all at the top of their game…
What do you enjoy most about working at Ionoptika?
I think the variety of applications of our products is what makes the job so exciting. Our customers are involved in so many different areas of research, from ground-breaking cancer research to building quantum computers, and they are all at the top of their game. So we have to try and keep up with them, which can be challenging at times, but you also learn so much. It’s also really fulfilling to know that you’ve played a role in helping these amazing scientists to expand their research capabilities and potentially make life-changing discoveries.
Can you describe a typical day working at Ionoptika (normally, not in the middle of a pandemic!)
I know it’s a cliché, but every day really is different. One day I can be analysing samples on the J105 SIMS for a potential customer, and the next I might be putting together marketing material for an upcoming conference or writing content for our website. We have a small team here, so we have to be very dynamic. Everyone works really hard for each other, which is great.
What has been your best memory or achievement in your working life?
I think my best memory so far would be the SIMS conference in Kyoto in 2019. We worked hard in the build-up, and it was just a great conference and such an amazing city. The food was possibly the highlight for me! One of the great perks of the job is getting to travel all around the world and see some amazing places, but that one takes the cake. The Rugby World Cup was also on in Japan at the same time – so that worked out well!
What do you enjoy doing in your spare time?
I have a passion for food and love to cook. At the moment I’m learning the art of stir fry. I also love strength sports and can usually be found in the gym, or at home watching rugby.
Have you been doing anything interesting/different/new to cope with the pandemic?
I am enjoying speciality coffee a lot lately. I’ve been trying all different styles of brewing and coffees from different parts of the world. I would highly recommend naturally processed coffees for anyone who hasn’t tried them – lots of tropical fruit notes – so delicious!
What are you looking forward to most once the Covid restrictions have eased?
We had to postpone our wedding because of lockdown, so that’s the main focus right now. We’re having it back home in Ireland and hopefully, we can have a massive party once this is all over!
Interested in becoming part of our team? Visit our Careers page.
70th ASMS Conference on Mass Spectrometry and Allied Topics
Yes, we’re going to ASMS! We can’t wait to see everyone again, so please do drop by our booth and let’s catch up!
See you in Minneapolis!
Stigmatic imaging SIMS prototype installed at the University of Oxford
Ionoptika have installed a prototype mass spec instrument at the University of Oxford, marking an exciting development milestone in this project. The prototype, which is a collaboration between the Rosalind Franklin Institute, the University of Oxford, and Ionoptika, is a new design of stigmatic imaging mass spectrometer.
The first stage of this project took place at Ionoptika’s headquarters near Southampton, where this unique instrument was built and tested. Researchers at the University of Oxford will now begin initial characterization and alignment of the primary ion beam, before the addition of extraction optics and high speed stigmatic detectors.
The stigmatic imaging SIMS instrument will enable rapid molecular mapping of biological tissues at unprecedented speed, as this type of mass spectrometry imaging decouples acquisition time from spatial resolution. Typically mass spectrometry imaging, such as the J105 SIMS, scans across a surface taking a mass spectrum at each spot to build up the pixels of the image.
In this case, however, the whole surface is imaged simultaneously using state of the art cameras that operate as an array of position and time sensitive detectors that record a mass spectrum for each pixel in the camera image. It therefore represents a promising route to attaining higher throughput.
The Rosalind Franklin Institute is a new national institute, funded by the UK government through UK Research and Innovation, dedicated to bringing about transformative changes in life science through interdisciplinary research and technology development. The work is focused into five complementary themes including a Biological Mass Spectrometry theme, of which this new prototype is a part.
Read the full press release here.
Ionoptika offers custom vacuum instrumentation and ion beam systems for a range of applications, including vacuum chambers, sample handling and load-locks, cameras, and secondary electron imaging, as well as our range of ion beams. If you have a project in mind and would like a no obligation quote, get in touch via our Contact Page and we would be delighted to discuss it with you.
Employee Spotlight: Kate McHardy – Head of Sales
Ionoptika is very proud of its skilled and dedicated staff, who together with our loyal users make up our global community. Our new regular post will shine the spotlight on some of the people who make up Ionoptika!
This week’s spotlight focuses on Ionoptika’s Head of Sales, Kate McHardy. Kate joined Ionoptika in 2019, so is still a relative newcomer to the team. We asked her what she makes of life at Ionoptika so far!
How long have you worked at Ionoptika and what career path brought you to us?
I joined Ionoptika in April 2019, having spent the previous 17 years working in a similar role at a company called Oxford Cryosystems, specialising in cooling devices and cryostats, mainly for X-ray crystallography applications. Like Ionoptika, Oxford Cryosystems was a small yet specialist research and engineering company. I loved my time there and still have many friends at the company, but after 17 years, felt it was time for a change!
What do you enjoy most about working at Ionoptika?
One of the most exciting things about Ionoptika for me is the important applications that our instruments can be used for. Our J105 SIMS, for example, has been used as a research tool for understanding skin cancer and breast cancer; or demonstrating the presence of cocaine metabolites in fingerprints. It is quite inspiring to meet the researchers working in such important areas, and to feel that the instruments we develop and offer can add such value to these important fields.
I have been involved in international sales and marketing for many years now, and one of my favourite parts of the role is getting out to see customers at their labs to appreciate the work they are doing and attending conferences and exhibitions. So this year, the restrictions on international travel have been rather frustrating!
We have a very talented team at Ionoptika, working on some really diverse R&D projects, so there is no shortage of work for the Sales & Marketing team, as we work out how to commercialise these new developments.
What would a typical day look like for you working in Sales?
In any other year, our Sales & Marketing team attend a lot of conferences and exhibitions. So a typical day might involve preparing for those coming up, attending the meetings, both as a delegate and exhibitor, meeting existing and potential new customers, or following up on discussions we have previously had. This year, this has been replaced with a lot of planning for the future and Zoom meetings!
However, one of the great things about working for Ionoptika, is that no day is the same; and this year, working from home, that’s saying a lot! We have a very talented team at Ionoptika, working on some really diverse R&D projects, so there is no shortage of work for the Sales & Marketing team, as we work out how to commercialise these new developments.
What has been your best memory or achievement in your time at Ionoptika?
In the 18 months of my time with Ionoptika, unfortunately half of that time has been during the Covid-19 pandemic! However my first 9 months with the company was extremely busy and I was lucky enough to attend the SIMS 22 conference in Kyoto, which really allowed me to meet a lot of our customers and collaborators.
What do you enjoy doing in your spare time?
I have only lived on the South Coast for 18 months now, so I am really enjoying getting out walking and exploring the beautiful local area. I do have a passion for travel, but this year, that has necessarily had to be a bit closer to home!
Have you been doing anything interesting/different/new to cope with the lockdown?
Lots of gardening during the summer and lots of walking now!
What are you looking forward to most once the lockdown is over?
At the moment, our region’s restrictions mean we can’t meet other households, so I am most looking forward to meeting up with friends again and being a bit more social. And overseas travel of course, I certainly miss that!
Interested in becoming part of our team? Visit our Careers page.
UK National Quantum Technologies Showcase
We are pleased to once again take part in the UK National Quantum Technologies Showcase. We look forward to seeing you on November 5th!