IOG-25Ga Liquid Metal Ion Beam System
IOG-25AU Liquid Metal Ion Beam System

IOG 25AU

< 100 nm[/av_cell][/av_row] [av_row row_style=''][av_cell col_style='']Computer…
GCIB-40 40kV Gas Cluster Ion Beam System
GCIB-SM 70kV Gas Cluster Ion Beam System
GCIB 10S Gas Cluster Ion BeamIonoptika 2020
PUL03 Nanosecond Pulser
IOE10 Electron Beam System
SED03 Secondary Electron Detection System
RSU2000 Raster Scanning Unit
IGM300 Integrated Imaging System
SIMS showing Cr signal of M1.6 screw thread

ToF SIMS of Rough or Uneven Samples

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A common problem faced by TOF SIMS analysis is loss of peak resolution and mass accuracy on…
3D SIMS overlay of a single Tetrahymena cell in water ice on a silicon substrate.

Depth Profiling in ToF-SIMS with the J105 SIMS

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Depth profiling is a powerful technique in surface analysis for examining interfaces and exploring…