IOG-30D Duoplasmatron Ion Beam System

IOG 30D

< 500 nm[/av_cell][/av_row] [av_row row_style=''][av_cell col_style='']Mass…
IOG-25Ga Liquid Metal Ion Beam System
IOG-25AU Liquid Metal Ion Beam System

IOG 25AU

< 100 nm[/av_cell][/av_row] [av_row row_style=''][av_cell col_style='']Computer…
GCIB-40 40kV Gas Cluster Ion Beam System

GCIB 40

The System The GCIB 40 system comprises: Ion source, comprising cluster…
GCIB-SM 70kV Gas Cluster Ion Beam System
GCIB 10S Gas Cluster Ion BeamIonoptika 2020
PUL03 Nanosecond Pulser
IOE10 Electron Beam System
SED03 Secondary Electron Detection System
RSU2000 Raster Scanning Unit
IGM300 Integrated Imaging System
SIMS showing Cr signal of M1.6 screw thread

ToF SIMS of Rough or Uneven Samples

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A common problem faced by TOF SIMS analysis is loss of peak resolution and mass accuracy on…