This month we move away from new hires to what will be a very familiar face to many of our customers around the world, Senior Test & Service Engineer, Gavyn Trowbridge.
GCIB-SEM is a new technique that combines high resolution electron microscopy with the damage…
https://ionoptika.com/wp-content/uploads/2020/06/gcib-10s-banner-v2-906x415-1.jpg415906webmasterhttps://ionoptika.com/wp-content/uploads/2018/06/IO_logo_black_700x322.pngwebmaster2020-06-09 15:23:042022-12-05 16:05:54GCIB-SEM: 3D electron microscopy with < 10nm isotropic resolution
On Thursday, in collaboration with UCVAC, we held a webinar on the GCIB 10S Gas Cluster Ion…
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This month, continuing the theme of new hires, we introduce Development Engineer, Dr. Michal Ryszka, who joined Ionoptika in 2019.
https://ionoptika.com/wp-content/uploads/2020/05/Michal-1.jpg647800webmasterhttps://ionoptika.com/wp-content/uploads/2018/06/IO_logo_black_700x322.pngwebmaster2020-05-06 15:49:132020-06-10 13:41:05Employee Spotlight: Dr Michal Ryszka
The high attrition rate of pharmaceutical drug compounds
adds enormously to the cost of those…
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The first to be in the spotlight is one of most recent hires, Dr Naoko Sano, our new Applications Scientist. We asked Naoko about her career and what she enjoys about working at Ionoptika.
https://ionoptika.com/wp-content/uploads/2020/04/Naoko-scaled-e1594282469266.jpg8641209webmasterhttps://ionoptika.com/wp-content/uploads/2018/06/IO_logo_black_700x322.pngwebmaster2020-04-08 12:12:112020-07-09 08:14:56Employee Spotlight: Dr Naoko Sano
Ionoptika has joined forces with 14 partners from public research and 3 other SMEs for…
https://ionoptika.com/wp-content/uploads/2020/03/RADIATE_logo-300x214-1.png214300webmasterhttps://ionoptika.com/wp-content/uploads/2018/06/IO_logo_black_700x322.pngwebmaster2020-03-06 08:49:312022-12-05 16:17:28RADIATE: Research And Development with Ion Beams – Advancing Technology in Europe
Plant samples such as leaves are a challenging sample for ToF SIMS. Composed of insulating…
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Analyse v2.0.2.15 Release
Employee Spotlight: Gavyn Trowbridge
GCIB-SEM: 3D electron microscopy with < 10nm isotropic resolution
Why you shouldn’t overlook C60 beams just yet
GCIB 10S Webinar in association with UCVAC
Employee Spotlight: Dr Michal Ryszka
Drug detection with high-sensitivity using ToF SIMS
Employee Spotlight: Dr Naoko Sano
RADIATE: Research And Development with Ion Beams – Advancing Technology in Europe
J105 SIMS
High-resolution molecular imaging ToF SIMS
Detecting pollutants in a Cherry Blossom leaf