Instruments
TOF SIMS INSTRUMENTS AND ION IMPLANTERS
Instruments
For over 30 years, Ionoptika has stood at the forefront of Ion Beam technology. From our inception, we’ve specialised in designing and developing high-performance instruments, collaborating closely with leading manufacturers and researchers worldwide. Today, we continue to push boundaries, offering advanced instruments that redefine what’s possible in surface analysis, materials engineering, and beyond.
WE EMBRACE CHALLENGES
A Track Record of Innovation
Ionoptika has always embraced challenges that others might consider too complex or demanding. This approach has led to amazing milestones in our history, including the creation of the first carbon fullerene (C60) ion source and the first gold cluster ion source for secondary ion mass spectrometry (SIMS). These innovations display our pioneering spirit, and they have paved the way for cutting-edge instruments that are trusted by researchers across various disciplines.
To find out more about how our innovative products work in practice, visit our applications page.
DEVELOPED WITH EXPERTS IN MIND
Our Instruments
J Series III
The J Series III is the pinnacle of innovation in ToF SIMS instruments. The J Series III offers unparalleled capabilities for 2D and 3D molecular and elemental imaging. This instrument is specifically designed for researchers who demand the highest sensitivity and resolution, particularly when analysing complex samples.
As a ToF SIMS instrument supplier, we are proud to offer a tool that excels in a wide range of applications, from forensic science and cancer diagnosis to lipidomics. J Series III is equipped with Gas Cluster Ion Beams (GCIB) technology, which is particularly beneficial when analysing delicate biological samples, hybrid materials, and polymers.
What sets the J Series III apart is its versatility. With the ability to use various Ion Beams, including high-energy small argon clusters and giant water clusters, this instrument creates a vast array of experimental conditions.
Key Features:
High Mass Resolving Power
Advanced Cryo System
Superior 3D Imaging
Unsurpassed Sensitivity
Want to learn more about the J Series III?
Q-One
Ionoptika’s Q-One ion implanter is the world’s first instrument specifically designed for deterministic single-ion implantation. This state-of-the-art platform is at the cutting edge of quantum technology and nanoscale materials engineering. The Q-One enables the placement of single ions with exceptional precision, making it indispensable for researchers working on the next generation of quantum devices.
Deterministic single ion implantation is a critical technique in quantum research, where the exact placement of individual atoms is essential. The Q-One achieves this with up to 98% detection efficiency, thanks to our proprietary DetectION™ technology. This system ensures that each ion implantation event is detected and recorded, providing the accuracy required for advanced quantum applications.
Key Features:
High-Resolution Ion Beam
Wide Range of Ion Sources
Nanometre Precision
Proprietary Software
Want to learn more about the Q-One?
Our Expertise Doesn’t Stop at Ion Sources
Over the years, we’ve expanded our capabilities to include full instrument design. We realised early on that the needs of the scientific community often surpass what off-the-shelf solutions can offer. This understanding has driven us to develop bespoke instruments tailored to meet the exacting requirements of modern research. That’s why Ionoptika is now recognised as a top ToF SIMS instrument supplier, offering both custom solutions and ready-to-use instruments that are at the cutting edge of technology.
You can find out much more about our bespoke solutions by following the link below.
