Drug detection with high-sensitivity using ToF SIMS

The high attrition rate of pharmaceutical drug compounds adds enormously to the cost of those…

Employee Spotlight: Dr Naoko Sano

The first to be in the spotlight is one of most recent hires, Dr Naoko Sano, our new Applications Scientist. We asked Naoko about her career and what she enjoys about working at Ionoptika.

RADIATE: Research And Development with Ion Beams – Advancing Technology in Europe

Ionoptika has joined forces with 14 partners from public research and 3 other SMEs for…
Ionoptika 2020

J105 SIMS

Unique Analyser The unique buncher-ToF analyser delivers high mass resolution…
Featured ImageIonoptika Ltd 2020

High-resolution molecular imaging ToF SIMS

Historically ToF SIMS has not been sensitive to intact molecules due to the excessive fragmentation…
Cherry blossoms mount fuji

Detecting pollutants in a Cherry Blossom leaf

Plant samples such as leaves are a challenging sample for ToF SIMS. Composed of insulating…
A New Single Ion Implantation Tool

A New Tool for Quantum Device Fabrication

July 10th 2018 — A new single ion implantation tool is launched at the UK National Ion Beam…
SIMS-China 2018

The 7th Chinese National Conference on Secondary Ion Mass Spectrometry (SIMS-China VII)

Ionoptika are delighted to announce we are sponsoring the 7th Chinese National Conference on…
FLIG5 Floating Ion Beam System

FLIG® 5

< 50 μm[/av_cell][/av_row] [/av_table] [/av_three_fifth][av_one_fifth min_height=''…
IOG-30D Duoplasmatron Ion Beam System

IOG 30D

< 500 nm[/av_cell][/av_row] [av_row row_style=''][av_cell col_style='']Mass…
IOG-25Ga Liquid Metal Ion Beam System