Employee Spotlight: Gavyn Trowbridge
This month we move away from new hires to what will be a very familiar face to many of our customers around the world, Senior Test & Service Engineer, Gavyn Trowbridge.
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GCIB-SEM: 3D electron microscopy with < 10nm isotropic resolution
GCIB-SEM is a new technique that combines high resolution electron microscopy with the damage free sputtering of gas cluster ions to produce incredible 3D tomography with less than 10 nm […]
Why you shouldn’t overlook C60 beams just yet
C60 cluster ion beams are a fantastic tool for analyzing both hard and soft materials. Composed of sixty carbon atoms arranged into a football shape, C60 ions combine several different […]
GCIB 10S Webinar in association with UCVAC
On Thursday, in collaboration with UCVAC, we held a webinar on the GCIB 10S Gas Cluster Ion Beam for potential customers in China. The webinar was a great success, and […]
Employee Spotlight: Dr Michal Ryszka
This month, continuing the theme of new hires, we introduce Development Engineer, Dr. Michal Ryszka, who joined Ionoptika in 2019.
Drug detection with high-sensitivity using ToF SIMS
The high attrition rate of pharmaceutical drug compounds adds enormously to the cost of those that make it to market, so there is an urgent and growing need to identify […]
Employee Spotlight: Dr Naoko Sano
The first to be in the spotlight is one of most recent hires, Dr Naoko Sano, our new Applications Scientist. We asked Naoko about her career and what she enjoys about working at Ionoptika.
RADIATE: Research And Development with Ion Beams – Advancing Technology in Europe
Ionoptika has joined forces with 14 partners from public research and 3 other SMEs for the RADIATE project, exchanging experience and best practice examples in order to structure the European […]
High-resolution molecular imaging ToF SIMS
Historically ToF SIMS has not been sensitive to intact molecules due to the excessive fragmentation caused by the primary ion beam. Now however, thanks to the progress in gas cluster […]
Detecting pollutants in a Cherry Blossom leaf
Plant samples such as leaves are a challenging sample for ToF SIMS. Composed of insulating materials such as cellulose (cell walls) and lipophilic coatings (cuticular layer), charge build up can […]
A New Tool for Quantum Device Fabrication
July 10th 2018 — A new single ion implantation tool is launched at the UK National Ion Beam Centre. Part of a 3 year project between Ionoptika and the University of […]
The 7th Chinese National Conference on Secondary Ion Mass Spectrometry (SIMS-China VII)
Ionoptika are delighted to announce we are sponsoring the 7th Chinese National Conference on Secondary Ion Mass Spectrometry (SIMS-China VII), which will be held from 9-12th October, 2018, at the […]