Applications
TOF SIMS
APPLICATIONS
Time-of-Flight Secondary Ion Mass Spectrometry (ToF SIMS) is a powerful surface analysis technique used to study the chemical composition of solid surfaces and thin films in three dimensions. Ion beams are central to TOF SIMS, as a beam of primary ions generates the secondary ions by bombarding a target surface.
Ionoptika pioneered using gas cluster ion beams (GCIB) for TOF SIMS applications with the J105 SIMS. GCIBs are very gentle and cause almost no damage, allowing the analysis of more sensitive samples. This has caused an explosion of new applications, particularly in the life sciences.
Explore applications of the J105 SIMS and our ion beams for TOF SIMS below.
3D TOF SIMS image of multi-layer glass coating. The potassium signal reveals two “tunnels” through the layer just a few microns wide. TOF SIMS data is characterised by high spatial resolution and chemical sensitivity, especially when using cluster ion beams.
https://ionoptika.com/wp-content/uploads/2018/03/ion-beams-banner-906x415-1.jpg 415 906 webmaster https://ionoptika.com/wp-content/uploads/2018/06/IO_logo_black_700x322.png webmaster2022-05-19 13:31:132022-12-05 16:18:52Ion Beams and their Applications
Ionoptika https://ionoptika.com/wp-content/uploads/2021/11/tof-sims-thumbnail-16-9.jpg 810 1439 webmaster https://ionoptika.com/wp-content/uploads/2018/06/IO_logo_black_700x322.png webmaster2022-05-18 14:32:032022-12-05 16:19:22ToF SIMS – Time of Flight Secondary Ion Mass Spectrometry
Ionoptika Ltd https://ionoptika.com/wp-content/uploads/2020/03/4161-Edit-740x491-1.jpg 491 740 webmaster https://ionoptika.com/wp-content/uploads/2018/06/IO_logo_black_700x322.png webmaster2022-05-01 08:29:002022-12-05 16:05:18How the J105 SIMS works: An introductory guide
https://ionoptika.com/wp-content/uploads/2022/03/single-cells-fluorescence.jpg 415 906 webmaster https://ionoptika.com/wp-content/uploads/2018/06/IO_logo_black_700x322.png webmaster2022-03-23 14:03:402022-12-05 16:20:03High-resolution multi-omics profiling of individual cells
Ionoptika 2020 https://ionoptika.com/wp-content/uploads/2020/05/C60_gold_extended-for-web_fog-overlay.jpg 415 906 webmaster https://ionoptika.com/wp-content/uploads/2018/06/IO_logo_black_700x322.png webmaster2020-05-29 16:37:572022-12-05 16:08:42Why you shouldn’t overlook C60 beams just yet
Ionoptika Ltd 2020 https://ionoptika.com/wp-content/uploads/2020/03/Featured-image-1.jpg 415 906 webmaster https://ionoptika.com/wp-content/uploads/2018/06/IO_logo_black_700x322.png webmaster2020-03-02 11:37:122022-12-05 16:16:32High-resolution molecular imaging ToF SIMS
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https://ionoptika.com/wp-content/uploads/2018/02/GCIB-40_thumb.jpg 800 990 webmaster https://ionoptika.com/wp-content/uploads/2018/06/IO_logo_black_700x322.png webmaster2018-02-19 11:16:202021-06-23 10:44:46GCIB 40
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https://ionoptika.com/wp-content/uploads/2018/02/PUL03_thumb-1.jpg 800 990 webmaster https://ionoptika.com/wp-content/uploads/2018/06/IO_logo_black_700x322.png webmaster2018-02-08 11:43:072021-06-23 11:56:52PUL 03
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Ionoptika https://ionoptika.com/wp-content/uploads/2021/09/C60-40DP-001-990x800-1.jpg 800 990 webmaster https://ionoptika.com/wp-content/uploads/2018/06/IO_logo_black_700x322.png webmaster2018-01-23 16:17:342021-09-02 13:04:45IOG C60-40
https://ionoptika.com/wp-content/uploads/2018/02/C60-20_thumb.jpg 800 990 webmaster https://ionoptika.com/wp-content/uploads/2018/06/IO_logo_black_700x322.png webmaster2018-01-23 16:04:152021-06-23 10:20:46IOG C60-20
Time-of-Flight Secondary Ion Mass Spectrometer that delivers class-leading sensitivity with exceptional imaging and mass spectrometry performance.
A high-performance cluster beam for molecular SIMS analysis. From bio-medical applications to polymer science and metallurgy, the C60-40 is an excellent all-round ion beam.
A high-resolution gas cluster ion beam with spot sizes down to 1.5 μm. Gas clusters are extremely efficient at sputtering organic, and biological materials, producing intact high-mass molecular ions. Available with Water Source upgrade.
