Applications
Surface
Science
APPLICATIONS
Studying the physics and chemistry of surfaces and interfaces requires clean surfaces, free from contamination. Surface analysis techniques such as Secondary Ion Mass Spectrometry (SIMS), X-ray Photoelectron Spectroscopy (XPS), Auger Electron Spectroscopy (AES), and Low Energy Electron Diffraction (LEED) all use ion beams to prepare surfaces for analysis, or in some cases, to provide the analysis.
Ion beams such as C60 and gas cluster ion beams (GCIB) efficiently remove organic matter from surfaces. In a process known as depth profiling, ion beams can also remove a volume of material, known as sputtering, revealing a fresh surface for analysis.
Ionoptika provides ion beams and instrumentation to suit every Surface Science application. Explore our products and applications below.
XPS data showing the PET C 1s peaks before and after etching with a monatomic argon beam and a gas cluster ion beam.
https://ionoptika.com/wp-content/uploads/2018/03/ion-beams-banner-906x415-1.jpg 415 906 webmaster https://ionoptika.com/wp-content/uploads/2018/06/IO_logo_black_700x322.png webmaster2022-05-19 13:31:132022-12-05 16:18:52Ion Beams and their Applications
https://ionoptika.com/wp-content/uploads/2022/03/single-cells-fluorescence.jpg 415 906 webmaster https://ionoptika.com/wp-content/uploads/2018/06/IO_logo_black_700x322.png webmaster2022-03-23 14:03:402022-12-05 16:20:03High-resolution multi-omics profiling of individual cells
https://ionoptika.com/wp-content/uploads/2021/04/Oxford-RFI-install-scaled.jpg 1920 2560 webmaster https://ionoptika.com/wp-content/uploads/2018/06/IO_logo_black_700x322.png webmaster2021-04-08 15:07:042022-12-05 16:02:30Stigmatic imaging SIMS prototype installed at the University of Oxford
Ionoptika 2020 https://ionoptika.com/wp-content/uploads/2020/06/gcib-10s-banner-v2-906x415-1.jpg 415 906 webmaster https://ionoptika.com/wp-content/uploads/2018/06/IO_logo_black_700x322.png webmaster2020-06-09 15:23:042022-12-05 16:05:54GCIB-SEM: 3D electron microscopy with < 10nm isotropic resolution
Ionoptika 2020 https://ionoptika.com/wp-content/uploads/2020/05/C60_gold_extended-for-web_fog-overlay.jpg 415 906 webmaster https://ionoptika.com/wp-content/uploads/2018/06/IO_logo_black_700x322.png webmaster2020-05-29 16:37:572022-12-05 16:08:42Why you shouldn’t overlook C60 beams just yet
Ionoptika 2020 https://ionoptika.com/wp-content/uploads/2020/05/gcib-webinar-thumbnail.jpg 370 520 webmaster https://ionoptika.com/wp-content/uploads/2018/06/IO_logo_black_700x322.png webmaster2020-05-21 15:41:502022-12-05 16:09:24GCIB 10S Webinar in association with UCVAC
https://ionoptika.com/wp-content/uploads/2020/04/High-sensitivity-Drug-Detection-using-Water-Cluster-SIMS.jpg 909 1500 webmaster https://ionoptika.com/wp-content/uploads/2018/06/IO_logo_black_700x322.png webmaster2020-04-17 11:02:252022-12-05 16:10:39Drug detection with high-sensitivity using ToF SIMS
https://ionoptika.com/wp-content/uploads/2020/03/RADIATE_logo-300x214-1.png 214 300 webmaster https://ionoptika.com/wp-content/uploads/2018/06/IO_logo_black_700x322.png webmaster2020-03-06 08:49:312022-12-05 16:17:28RADIATE: Research And Development with Ion Beams – Advancing Technology in Europe
Ionoptika Ltd 2020 https://ionoptika.com/wp-content/uploads/2020/03/Featured-image-1.jpg 415 906 webmaster https://ionoptika.com/wp-content/uploads/2018/06/IO_logo_black_700x322.png webmaster2020-03-02 11:37:122022-12-05 16:16:32High-resolution molecular imaging ToF SIMS
https://ionoptika.com/wp-content/uploads/2020/02/cherry_banner.jpg 415 906 webmaster https://ionoptika.com/wp-content/uploads/2018/06/IO_logo_black_700x322.png webmaster2020-02-28 13:13:472022-12-05 16:15:51Detecting pollutants in a Cherry Blossom leaf
https://ionoptika.com/wp-content/uploads/2018/02/screwthread_big-1.jpg 321 700 webmaster https://ionoptika.com/wp-content/uploads/2018/06/IO_logo_black_700x322.png webmaster2018-02-06 16:14:402022-12-05 16:13:16ToF SIMS of Rough or Uneven Samples
https://ionoptika.com/wp-content/uploads/2018/02/depth_post_big.jpg 321 700 webmaster https://ionoptika.com/wp-content/uploads/2018/06/IO_logo_black_700x322.png webmaster2018-02-06 15:38:592022-12-05 16:13:29Depth Profiling in ToF-SIMS with the J105 SIMS
https://ionoptika.com/wp-content/uploads/2018/02/insulating_rock_big.jpg 321 700 webmaster https://ionoptika.com/wp-content/uploads/2018/06/IO_logo_black_700x322.png webmaster2018-02-06 09:59:362022-12-05 16:11:53ToF-SIMS Analysis on Insulating Samples
A high-performance gas cluster ion beam delivering low-damage sputtering in a feature-packed, low-maintenance package.
Time-of-Flight Secondary Ion Mass Spectrometer that delivers class-leading sensitivity with exceptional imaging and mass spectrometry performance.
A carbon fullerene ion beam designed for sputtering surfaces with minimal damage, ideal as an upgrade for XPS, AES, and SIMS.
A focused ion beam platform for advanced device fabrication and nanoscale materials engineering.
| J105 SIMS | Sensitivity enhancement using chemically reactive gas cluster ion beams in secondary ion mass spectrometry (SIMS) | M Lagator, I Berrueta Razo, T Royle, NP Lockyer | Surface and Interface Analysis | 2022 | TOF SIMS, Water Source |
| GCIB 10S | Characterization of buried interfaces using Ga Kα hard X-ray photoelectron spectroscopy (HAXPES) | BF Spencer, SA Church, P Thompson, DJH Cant, S Maniyarasu, A Theodosiou, AN Jones, MJ Kappers, DJ Binks, RA Oliver, J Higgins, AG Thomas, T Thomson, AG Shard, WR Flavell | Faraday Discussions | 2022 | XPS, HAXPES |
| Q-One | Single Ion Implantation of Bismuth | N Cassidy, P Blenkinsopp, I Brown, RJ Curry, BN Murdin, R Webb, D Cox | Physica Status Solidi A | 2020 | Ion Implantation, Quantum Computing, Qubits, Q-One |
| J105 SIMS | C-O Bond Dissociation and Induced Chemical Ionization Using High Energy (CO2)n+ Gas Cluster Ion Beam | H Tian, D Maciazek, Z Postawa, BJ Garrison, N Winograd | Journal of the American Society for Mass Spectrometry | 2019 | TOF SIMS, Cluster Beams |
| GCIB 10S | Depth resolution at organic interfaces sputtered by argon gas cluster ions: the effect of energy, angle and cluster size | MP Seah, SJ Spencer, R Havelund, IS Gilmore, AG Shard | Analyst | 2015 | Depth profiling, XPS |
| GCIB 10S | Analysis of protein coatings on gold nanoparticles by XPS and liquid-based particle sizing techniques | NA Belsey, AG Shard, C Minelli | Biointerfaces | 2015 | XPS, nanoparticles |